Palumbo, F. R. M., Shekhter, P., & Eizenberg, M. (2014). Influence of the oxide–semiconductor interface on the resistive switching phenomenon in metal/Al2O3/InGaAs. Web
Citación estilo ChicagoPalumbo, Félix Roberto Mario, P. Shekhter, and M. Eizenberg. Influence of the Oxide–semiconductor Interface On the Resistive Switching Phenomenon in Metal/Al2O3/InGaAs. 2014.
Cita MLAPalumbo, Félix Roberto Mario, P. Shekhter, and M. Eizenberg. Influence of the Oxide–semiconductor Interface On the Resistive Switching Phenomenon in Metal/Al2O3/InGaAs. 2014.
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