Cita APA

Kayis, C., Ferreyra, R. A., Wu, M., Li, X., Ozgur, U., Matulionis, A., & Morkoç, H. (2011). Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effects. Web

Citación estilo Chicago

Kayis, C., Romualdo Alejandro Ferreyra, M. Wu, Xiaolin Li, U. Ozgur, A. Matulionis, and H. Morkoç. Degradation in InAlN/AlN/GaN Heterostructure Field-effect Transistors As Monitored By Low-frequency Noise Measurements: Hot Phonon Effects. 2011.

Cita MLA

Kayis, C., et al. Degradation in InAlN/AlN/GaN Heterostructure Field-effect Transistors As Monitored By Low-frequency Noise Measurements: Hot Phonon Effects. 2011.