Cita APA

Palumbo, F. R. M., Lombardo,Salvatore, & Eizenberg, M. (2016). Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Web

Citación estilo Chicago

Palumbo, Félix Roberto Mario, Lombardo,Salvatore, and Moshe Eizenberg. Influence of Gate Oxides With High Thermal Conductivity On the Failure Distribution of InGaAs-based MOS Stacks. 2016.

Cita MLA

Palumbo, Félix Roberto Mario, Lombardo,Salvatore, and Moshe Eizenberg. Influence of Gate Oxides With High Thermal Conductivity On the Failure Distribution of InGaAs-based MOS Stacks. 2016.