Beating thermal noise in a dynamic signal measurement by a nanofabricated cavity optomechanical sensor

• Autores: Wang, Mingkang; Perez, Diego Javier; Ramer, Georg; Pavlidis, Georges; Schwartz, Jeffrey J.; Yu, Liya; Ilic, Robert; Centrone, Andrea; Aksyuk, Vladimir A.
• Año de publicación: 2023
• Idioma: inglés
• Tipo de recurso: artículo
• Materia: OPTOMECHANICAL; PROBES; PHOTONICS; PTIR
• Institución: Consejo Nacional de Investigaciones Científicas y Técnicas

Thermal fluctuations often impose both fundamental and practical measurement limits on high-performance sensors, motivating the development of techniques that bypass the limitations imposed by thermal noise outside cryogenic environments. Here, we theoretically propose and experimentally demonstrate a measurement method that reduces the effective transducer temperature and improves the measurement precision of a dynamic impulse response signal. Thermal noise–limited, integrated cavity optomechanical atomic force microscopy probes are used in a photothermal-induced resonance measurement to demonstrate an effective temperature reduction by a factor of ≈25, i.e., from room temperature down as low as ≈12 K, without cryogens. The method improves the experimental measurement precision and throughput by >2×, approaching the theoretical limit of ≈3.5× improvement for our experimental conditions. The general applicability of this method to dynamic measurements leveraging thermal noise–limited harmonic transducers will have a broad impact across a variety of measurement platforms and scientific fields.
Fil: Wang, Mingkang. University of Maryland; Estados Unidos
Fil: Perez, Diego Javier. University of Maryland; Estados Unidos. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Ramer, Georg. National Institute Of Standards And Technology; Estados Unidos. Technische Universitat Wien; Austria
Fil: Pavlidis, Georges. National Institute of Standards And Technology; Estados Unidos
Fil: Schwartz, Jeffrey J.. National Institute of Standards And Technology; Estados Unidos
Fil: Yu, Liya. National Institute of Standards And Technology; Estados Unidos
Fil: Ilic, Robert. National Institute of Standards And Technology; Estados Unidos
Fil: Centrone, Andrea. National Institute of Standards And Technology; Estados Unidos
Fil: Aksyuk, Vladimir A.. National Institute of Standards And Technology; Estados Unidos