Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation
- Autores
- Vera, Maria Laura; Alterach, Miguel Angel; Rosenberger, Mario Roberto; Lamas, Diego German; Schvezov, Carlos Enrique; Ares, Alicia Esther
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- The influence of sol-gel dip-coating and anodic oxidation process parameters to produce thin TiO2 films is studied. As the size of the films is in the order of nanometers (20-140 nm), to obtain a precise measurement of their thickness and analyze their crystalline structures, glancing incidence angle X-ray techniques (X-ray reflectometry and X-ray diffraction) using synchrotron radiation are used. A relationship between the color and thickness of the films was found. This enables the film thickness to be estimated by the film color. In the range of the parameters studied, both techniques produce thin films with smooth surfaces which at most reproduce the surface polished substrate roughness. Independently of the technique, thermally treated films thicker than 30 nm presented different crystalline structures with anatase and rutile phases.
Fil: Vera, Maria Laura. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina
Fil: Alterach, Miguel Angel. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina
Fil: Rosenberger, Mario Roberto. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina
Fil: Lamas, Diego German. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de Las Fuerzas Armadas. Centro de Investigaciones En Sólidos; Argentina
Fil: Schvezov, Carlos Enrique. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina
Fil: Ares, Alicia Esther. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina - Materia
-
Titanium Oxide Films
Sol-gel Dip-coating
Anodic Oxidation
X-ray Reflectometry
X-ray Diffraction - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/9706
Ver los metadatos del registro completo
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Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic OxidationVera, Maria LauraAlterach, Miguel AngelRosenberger, Mario RobertoLamas, Diego GermanSchvezov, Carlos EnriqueAres, Alicia EstherTitanium Oxide FilmsSol-gel Dip-coatingAnodic OxidationX-ray ReflectometryX-ray Diffractionhttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2The influence of sol-gel dip-coating and anodic oxidation process parameters to produce thin TiO2 films is studied. As the size of the films is in the order of nanometers (20-140 nm), to obtain a precise measurement of their thickness and analyze their crystalline structures, glancing incidence angle X-ray techniques (X-ray reflectometry and X-ray diffraction) using synchrotron radiation are used. A relationship between the color and thickness of the films was found. This enables the film thickness to be estimated by the film color. In the range of the parameters studied, both techniques produce thin films with smooth surfaces which at most reproduce the surface polished substrate roughness. Independently of the technique, thermally treated films thicker than 30 nm presented different crystalline structures with anatase and rutile phases.Fil: Vera, Maria Laura. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; ArgentinaFil: Alterach, Miguel Angel. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; ArgentinaFil: Rosenberger, Mario Roberto. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; ArgentinaFil: Lamas, Diego German. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de Las Fuerzas Armadas. Centro de Investigaciones En Sólidos; ArgentinaFil: Schvezov, Carlos Enrique. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; ArgentinaFil: Ares, Alicia Esther. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; ArgentinaINTECH2014-04info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/9706Vera, Maria Laura; Alterach, Miguel Angel; Rosenberger, Mario Roberto; Lamas, Diego German; Schvezov, Carlos Enrique; et al.; Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation; INTECH; Nanomaterials and Nanotechnology; 4; 10; 4-2014; 1-111847-9804enginfo:eu-repo/semantics/altIdentifier/url/http://www.intechopen.com/journals/articles/nanomaterials_and_nanotechnology/all/2info:eu-repo/semantics/altIdentifier/doi/10.5772/58522info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:54:45Zoai:ri.conicet.gov.ar:11336/9706instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:54:45.631CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
title |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
spellingShingle |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation Vera, Maria Laura Titanium Oxide Films Sol-gel Dip-coating Anodic Oxidation X-ray Reflectometry X-ray Diffraction |
title_short |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
title_full |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
title_fullStr |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
title_full_unstemmed |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
title_sort |
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation |
dc.creator.none.fl_str_mv |
Vera, Maria Laura Alterach, Miguel Angel Rosenberger, Mario Roberto Lamas, Diego German Schvezov, Carlos Enrique Ares, Alicia Esther |
author |
Vera, Maria Laura |
author_facet |
Vera, Maria Laura Alterach, Miguel Angel Rosenberger, Mario Roberto Lamas, Diego German Schvezov, Carlos Enrique Ares, Alicia Esther |
author_role |
author |
author2 |
Alterach, Miguel Angel Rosenberger, Mario Roberto Lamas, Diego German Schvezov, Carlos Enrique Ares, Alicia Esther |
author2_role |
author author author author author |
dc.subject.none.fl_str_mv |
Titanium Oxide Films Sol-gel Dip-coating Anodic Oxidation X-ray Reflectometry X-ray Diffraction |
topic |
Titanium Oxide Films Sol-gel Dip-coating Anodic Oxidation X-ray Reflectometry X-ray Diffraction |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/2.5 https://purl.org/becyt/ford/2 |
dc.description.none.fl_txt_mv |
The influence of sol-gel dip-coating and anodic oxidation process parameters to produce thin TiO2 films is studied. As the size of the films is in the order of nanometers (20-140 nm), to obtain a precise measurement of their thickness and analyze their crystalline structures, glancing incidence angle X-ray techniques (X-ray reflectometry and X-ray diffraction) using synchrotron radiation are used. A relationship between the color and thickness of the films was found. This enables the film thickness to be estimated by the film color. In the range of the parameters studied, both techniques produce thin films with smooth surfaces which at most reproduce the surface polished substrate roughness. Independently of the technique, thermally treated films thicker than 30 nm presented different crystalline structures with anatase and rutile phases. Fil: Vera, Maria Laura. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina Fil: Alterach, Miguel Angel. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina Fil: Rosenberger, Mario Roberto. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina Fil: Lamas, Diego German. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de Las Fuerzas Armadas. Centro de Investigaciones En Sólidos; Argentina Fil: Schvezov, Carlos Enrique. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina Fil: Ares, Alicia Esther. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnológico Nordeste. Instituto de Materiales de Misiones; Argentina |
description |
The influence of sol-gel dip-coating and anodic oxidation process parameters to produce thin TiO2 films is studied. As the size of the films is in the order of nanometers (20-140 nm), to obtain a precise measurement of their thickness and analyze their crystalline structures, glancing incidence angle X-ray techniques (X-ray reflectometry and X-ray diffraction) using synchrotron radiation are used. A relationship between the color and thickness of the films was found. This enables the film thickness to be estimated by the film color. In the range of the parameters studied, both techniques produce thin films with smooth surfaces which at most reproduce the surface polished substrate roughness. Independently of the technique, thermally treated films thicker than 30 nm presented different crystalline structures with anatase and rutile phases. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-04 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/9706 Vera, Maria Laura; Alterach, Miguel Angel; Rosenberger, Mario Roberto; Lamas, Diego German; Schvezov, Carlos Enrique; et al.; Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation; INTECH; Nanomaterials and Nanotechnology; 4; 10; 4-2014; 1-11 1847-9804 |
url |
http://hdl.handle.net/11336/9706 |
identifier_str_mv |
Vera, Maria Laura; Alterach, Miguel Angel; Rosenberger, Mario Roberto; Lamas, Diego German; Schvezov, Carlos Enrique; et al.; Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation; INTECH; Nanomaterials and Nanotechnology; 4; 10; 4-2014; 1-11 1847-9804 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/http://www.intechopen.com/journals/articles/nanomaterials_and_nanotechnology/all/2 info:eu-repo/semantics/altIdentifier/doi/10.5772/58522 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
INTECH |
publisher.none.fl_str_mv |
INTECH |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1842269304979980288 |
score |
13.13397 |