Klimovsky, E., Rath, J., Schropp, R., & Rubinelli, F. A. (2002). Errors introduced in the predicted a-Si: H based devices characteristic curves when dangling bonds are modeled by de-coupled states. Web
Citación estilo ChicagoKlimovsky, E,, J.K Rath, R.E.I Schropp, and Francisco Alberto Rubinelli. Errors Introduced in the Predicted A-Si: H Based Devices Characteristic Curves When Dangling Bonds Are Modeled By De-coupled States. 2002.
Cita MLAKlimovsky, E,, J.K Rath, R.E.I Schropp, and Francisco Alberto Rubinelli. Errors Introduced in the Predicted A-Si: H Based Devices Characteristic Curves When Dangling Bonds Are Modeled By De-coupled States. 2002.
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