Cita APA

Makinistian, L., Albanesi, E. A., Gonzalez Lemus, N. V., Petukhov, A. G., Schmidt, D., Schubert, E., . . . Dowben, P. (2010). Ab-initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4Se3. Web

Citación estilo Chicago

Makinistian, Leonardo, et al. Ab-initio Calculations and Ellipsometry Measurements of the Optical Properties of the Layered Semiconductor In4Se3. 2010.

Cita MLA

Makinistian, Leonardo, et al. Ab-initio Calculations and Ellipsometry Measurements of the Optical Properties of the Layered Semiconductor In4Se3. 2010.