Sanjuan, F. E., Bockelt, A., & Vidal, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Web
Citación estilo ChicagoSanjuan, Federico Ezequiel, Alexander Bockelt, and Borja Vidal. Determination of Refractive Index and Thickness of a Multilayer Structure With a Single Terahertz Time Domain Spectroscopy Measurement. 2014.
Cita MLASanjuan, Federico Ezequiel, Alexander Bockelt, and Borja Vidal. Determination of Refractive Index and Thickness of a Multilayer Structure With a Single Terahertz Time Domain Spectroscopy Measurement. 2014.
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