Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
- Autores
- Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; Argentina
Fil: Bockelt, Alexander. Universidad Politecnica de Valencia; España
Fil: Vidal, Borja. Universidad Politecnica de Valencia; España - Materia
-
Optical Properties
Spectroscopy
Interference
Terahertz - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/11863
Ver los metadatos del registro completo
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network_name_str |
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spelling |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurementSanjuan, Federico EzequielBockelt, AlexanderVidal, BorjaOptical PropertiesSpectroscopyInterferenceTerahertzhttps://purl.org/becyt/ford/2.2https://purl.org/becyt/ford/2A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; ArgentinaFil: Bockelt, Alexander. Universidad Politecnica de Valencia; EspañaFil: Vidal, Borja. Universidad Politecnica de Valencia; EspañaOptical Society Of America2014-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/11863Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-49131559-128X2155-3165enginfo:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.004910info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:36:25Zoai:ri.conicet.gov.ar:11336/11863instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:36:25.768CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
title |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
spellingShingle |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement Sanjuan, Federico Ezequiel Optical Properties Spectroscopy Interference Terahertz |
title_short |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
title_full |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
title_fullStr |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
title_full_unstemmed |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
title_sort |
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement |
dc.creator.none.fl_str_mv |
Sanjuan, Federico Ezequiel Bockelt, Alexander Vidal, Borja |
author |
Sanjuan, Federico Ezequiel |
author_facet |
Sanjuan, Federico Ezequiel Bockelt, Alexander Vidal, Borja |
author_role |
author |
author2 |
Bockelt, Alexander Vidal, Borja |
author2_role |
author author |
dc.subject.none.fl_str_mv |
Optical Properties Spectroscopy Interference Terahertz |
topic |
Optical Properties Spectroscopy Interference Terahertz |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/2.2 https://purl.org/becyt/ford/2 |
dc.description.none.fl_txt_mv |
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products. Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; Argentina Fil: Bockelt, Alexander. Universidad Politecnica de Valencia; España Fil: Vidal, Borja. Universidad Politecnica de Valencia; España |
description |
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-08 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/11863 Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913 1559-128X 2155-3165 |
url |
http://hdl.handle.net/11336/11863 |
identifier_str_mv |
Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913 1559-128X 2155-3165 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.004910 info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Optical Society Of America |
publisher.none.fl_str_mv |
Optical Society Of America |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
_version_ |
1844614384604676096 |
score |
13.070432 |