Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

Autores
Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; Argentina
Fil: Bockelt, Alexander. Universidad Politecnica de Valencia; España
Fil: Vidal, Borja. Universidad Politecnica de Valencia; España
Materia
Optical Properties
Spectroscopy
Interference
Terahertz
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/11863
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/11863
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurementSanjuan, Federico EzequielBockelt, AlexanderVidal, BorjaOptical PropertiesSpectroscopyInterferenceTerahertzhttps://purl.org/becyt/ford/2.2https://purl.org/becyt/ford/2A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; ArgentinaFil: Bockelt, Alexander. Universidad Politecnica de Valencia; EspañaFil: Vidal, Borja. Universidad Politecnica de Valencia; EspañaOptical Society Of America2014-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/11863Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-49131559-128X2155-3165enginfo:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.004910info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T12:08:44Zoai:ri.conicet.gov.ar:11336/11863instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 12:08:44.485CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
title Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
spellingShingle Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
Sanjuan, Federico Ezequiel
Optical Properties
Spectroscopy
Interference
Terahertz
title_short Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
title_full Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
title_fullStr Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
title_full_unstemmed Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
title_sort Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
dc.creator.none.fl_str_mv Sanjuan, Federico Ezequiel
Bockelt, Alexander
Vidal, Borja
author Sanjuan, Federico Ezequiel
author_facet Sanjuan, Federico Ezequiel
Bockelt, Alexander
Vidal, Borja
author_role author
author2 Bockelt, Alexander
Vidal, Borja
author2_role author
author
dc.subject.none.fl_str_mv Optical Properties
Spectroscopy
Interference
Terahertz
topic Optical Properties
Spectroscopy
Interference
Terahertz
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.2
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
Fil: Sanjuan, Federico Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico la Plata. Centro de Investigaciones Opticas (i); Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; Argentina
Fil: Bockelt, Alexander. Universidad Politecnica de Valencia; España
Fil: Vidal, Borja. Universidad Politecnica de Valencia; España
description A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
publishDate 2014
dc.date.none.fl_str_mv 2014-08
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/11863
Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913
1559-128X
2155-3165
url http://hdl.handle.net/11336/11863
identifier_str_mv Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913
1559-128X
2155-3165
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.004910
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Optical Society Of America
publisher.none.fl_str_mv Optical Society Of America
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1846782461125591040
score 12.982451

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