Cita APA

Aguirre, F. L., Pazos, S. M., Palumbo, F. R. M., Fadida, S., Winter, R., & Eizenberg, M. (2018). Effect of forming gas annealing on the degradation properties of Ge-based MOS stacks. Web

Citación estilo Chicago

Aguirre, Fernando Leonel, Sebastián Matías Pazos, Félix Roberto Mario Palumbo, S. Fadida, R. Winter, and M. Eizenberg. Effect of Forming Gas Annealing On the Degradation Properties of Ge-based MOS Stacks. 2018.

Cita MLA

Aguirre, Fernando Leonel, et al. Effect of Forming Gas Annealing On the Degradation Properties of Ge-based MOS Stacks. 2018.