Quinteros, C. P., Sambuco Salomone, L. I., Redin, E. G., Rafí, J. M., Zabala, M., Faigón, A., . . . Campabadal, F. (2012). Comparative analysis of MIS capacitance structures with high-k dielectrics under gamma, 16O and p Radiation. Web
Citación estilo ChicagoQuinteros, C. P., Lucas Ignacio Sambuco Salomone, Eduardo Gabriel Redin, J. M. Rafí, M. Zabala, A. Faigón, Félix Roberto Mario Palumbo, and F. Campabadal. Comparative Analysis of MIS Capacitance Structures With High-k Dielectrics Under Gamma, 16O and P Radiation. 2012.
Cita MLAQuinteros, C. P., et al. Comparative Analysis of MIS Capacitance Structures With High-k Dielectrics Under Gamma, 16O and P Radiation. 2012.
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