Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals
- Autores
- Almeida, César Américo; Groselli, Melina; González, Patricia; Martinez, Luis Dante; Gil, Raul Andres
- Año de publicación
- 2015
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- In this study, a batch leaching test was executed to evaluate the toxicity associated with chemicals contained in motherboards. The leaching solutions used were distilled water, nitric acid, acetic acid and synthetic acid rain solution. A total of 21 elements including Ag, As, Au, Br, Cd, Co, Cr, Cu, Hf, Ir, Mn, Ni, Os, Pb, Pd, Pt, Rd, Rh, Se, U and Zn were analyzed. In this study, the pH values of all the leachates fell within the range of 2.33–4.88. The highest concentrations of metals were obtained from the acid rain solution, whilst the maximum value of bromine was achieved with solution of acetic acid. Appreciable concentrations of platinum group elements were detected with concentrations around 3.45, 1.43, 1.21 and 22.19 µg L−1 for Ir, Pd, Pt and Rh, respectively. The different leaching of the motherboards revealed the predominant presence of the toxic substances in the leached from the e-waste.
Fil: Almeida, César Américo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina
Fil: Groselli, Melina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina
Fil: González, Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina
Fil: Martinez, Luis Dante. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina
Fil: Gil, Raul Andres. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina - Materia
-
Electronic Waste
Platinumgroup Elements
Bromine
Heavy Metals
Batch Leaching Tests
Icp-Ms - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
- Repositorio
.jpg)
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/14820
Ver los metadatos del registro completo
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Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metalsAlmeida, César AméricoGroselli, MelinaGonzález, PatriciaMartinez, Luis DanteGil, Raul AndresElectronic WastePlatinumgroup ElementsBromineHeavy MetalsBatch Leaching TestsIcp-Mshttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1In this study, a batch leaching test was executed to evaluate the toxicity associated with chemicals contained in motherboards. The leaching solutions used were distilled water, nitric acid, acetic acid and synthetic acid rain solution. A total of 21 elements including Ag, As, Au, Br, Cd, Co, Cr, Cu, Hf, Ir, Mn, Ni, Os, Pb, Pd, Pt, Rd, Rh, Se, U and Zn were analyzed. In this study, the pH values of all the leachates fell within the range of 2.33–4.88. The highest concentrations of metals were obtained from the acid rain solution, whilst the maximum value of bromine was achieved with solution of acetic acid. Appreciable concentrations of platinum group elements were detected with concentrations around 3.45, 1.43, 1.21 and 22.19 µg L−1 for Ir, Pd, Pt and Rh, respectively. The different leaching of the motherboards revealed the predominant presence of the toxic substances in the leached from the e-waste.Fil: Almeida, César Américo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; ArgentinaFil: Groselli, Melina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; ArgentinaFil: González, Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; ArgentinaFil: Martinez, Luis Dante. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; ArgentinaFil: Gil, Raul Andres. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; ArgentinaElsevier2015-09info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/14820Almeida, César Américo; Groselli, Melina; González, Patricia; Martinez, Luis Dante; Gil, Raul Andres; Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals; Elsevier; Chemosphere; 144; 9-2015; 1-60045-6535enginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.chemosphere.2015.08.035info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0045653515300369info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:20:27Zoai:ri.conicet.gov.ar:11336/14820instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:20:27.67CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
| dc.title.none.fl_str_mv |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| title |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| spellingShingle |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals Almeida, César Américo Electronic Waste Platinumgroup Elements Bromine Heavy Metals Batch Leaching Tests Icp-Ms |
| title_short |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| title_full |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| title_fullStr |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| title_full_unstemmed |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| title_sort |
Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals |
| dc.creator.none.fl_str_mv |
Almeida, César Américo Groselli, Melina González, Patricia Martinez, Luis Dante Gil, Raul Andres |
| author |
Almeida, César Américo |
| author_facet |
Almeida, César Américo Groselli, Melina González, Patricia Martinez, Luis Dante Gil, Raul Andres |
| author_role |
author |
| author2 |
Groselli, Melina González, Patricia Martinez, Luis Dante Gil, Raul Andres |
| author2_role |
author author author author |
| dc.subject.none.fl_str_mv |
Electronic Waste Platinumgroup Elements Bromine Heavy Metals Batch Leaching Tests Icp-Ms |
| topic |
Electronic Waste Platinumgroup Elements Bromine Heavy Metals Batch Leaching Tests Icp-Ms |
| purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.4 https://purl.org/becyt/ford/1 |
| dc.description.none.fl_txt_mv |
In this study, a batch leaching test was executed to evaluate the toxicity associated with chemicals contained in motherboards. The leaching solutions used were distilled water, nitric acid, acetic acid and synthetic acid rain solution. A total of 21 elements including Ag, As, Au, Br, Cd, Co, Cr, Cu, Hf, Ir, Mn, Ni, Os, Pb, Pd, Pt, Rd, Rh, Se, U and Zn were analyzed. In this study, the pH values of all the leachates fell within the range of 2.33–4.88. The highest concentrations of metals were obtained from the acid rain solution, whilst the maximum value of bromine was achieved with solution of acetic acid. Appreciable concentrations of platinum group elements were detected with concentrations around 3.45, 1.43, 1.21 and 22.19 µg L−1 for Ir, Pd, Pt and Rh, respectively. The different leaching of the motherboards revealed the predominant presence of the toxic substances in the leached from the e-waste. Fil: Almeida, César Américo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina Fil: Groselli, Melina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina Fil: González, Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina Fil: Martinez, Luis Dante. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina Fil: Gil, Raul Andres. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico San Luis. Instituto de Química de San Luis; Argentina. Universidad Nacional de San Luis; Argentina |
| description |
In this study, a batch leaching test was executed to evaluate the toxicity associated with chemicals contained in motherboards. The leaching solutions used were distilled water, nitric acid, acetic acid and synthetic acid rain solution. A total of 21 elements including Ag, As, Au, Br, Cd, Co, Cr, Cu, Hf, Ir, Mn, Ni, Os, Pb, Pd, Pt, Rd, Rh, Se, U and Zn were analyzed. In this study, the pH values of all the leachates fell within the range of 2.33–4.88. The highest concentrations of metals were obtained from the acid rain solution, whilst the maximum value of bromine was achieved with solution of acetic acid. Appreciable concentrations of platinum group elements were detected with concentrations around 3.45, 1.43, 1.21 and 22.19 µg L−1 for Ir, Pd, Pt and Rh, respectively. The different leaching of the motherboards revealed the predominant presence of the toxic substances in the leached from the e-waste. |
| publishDate |
2015 |
| dc.date.none.fl_str_mv |
2015-09 |
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info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
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article |
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publishedVersion |
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http://hdl.handle.net/11336/14820 Almeida, César Américo; Groselli, Melina; González, Patricia; Martinez, Luis Dante; Gil, Raul Andres; Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals; Elsevier; Chemosphere; 144; 9-2015; 1-6 0045-6535 |
| url |
http://hdl.handle.net/11336/14820 |
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Almeida, César Américo; Groselli, Melina; González, Patricia; Martinez, Luis Dante; Gil, Raul Andres; Batch leaching tests of motherboards to assess environmental contamination by bromine, platinum group elements and other selected heavy metals; Elsevier; Chemosphere; 144; 9-2015; 1-6 0045-6535 |
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eng |
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eng |
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info:eu-repo/semantics/altIdentifier/doi/10.1016/j.chemosphere.2015.08.035 info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0045653515300369 |
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Elsevier |
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