Structured light illumination for order sorting in Echelle spectrometers
- Autores
- Martínez Matos, Ó.; Vaveliuk, Pablo; Rickenstorff, C.
- Año de publicación
- 2017
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- We report on the operation of an echelle spectrometer under structured light illumination. Each diffraction order of the spectrometer is encoded with a certain periodic structure allowing for order sorting by numerical analysis after detection. In contrast to cross-dispersed echelle spectrometers, in this approach the orders overlap at the detection plane so that the spectral calibration can be performed easily with a single reference wavelength. This operational simplification makes it possible to measure simultaneously the light source under study and the calibration wavelength giving rise to a self-calibrated echelle spectrometer. In this way the device compensates for the spectral drift due to temporal changes of environmental conditions in real time. Our proposal can be useful in a large number of applications requiring moderate, high or very high resolving power for a wide bandwidth in a non-isolated environment.
Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; España
Fil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
Fil: Rickenstorff, C.. Universidad Complutense de Madrid; España - Materia
-
Spectrometers
Spectrum Analysis
Spectrometers And Spectroscopic Instrumentation
Interferometry - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/49240
Ver los metadatos del registro completo
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Structured light illumination for order sorting in Echelle spectrometersMartínez Matos, Ó.Vaveliuk, PabloRickenstorff, C.SpectrometersSpectrum AnalysisSpectrometers And Spectroscopic InstrumentationInterferometryhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1We report on the operation of an echelle spectrometer under structured light illumination. Each diffraction order of the spectrometer is encoded with a certain periodic structure allowing for order sorting by numerical analysis after detection. In contrast to cross-dispersed echelle spectrometers, in this approach the orders overlap at the detection plane so that the spectral calibration can be performed easily with a single reference wavelength. This operational simplification makes it possible to measure simultaneously the light source under study and the calibration wavelength giving rise to a self-calibrated echelle spectrometer. In this way the device compensates for the spectral drift due to temporal changes of environmental conditions in real time. Our proposal can be useful in a large number of applications requiring moderate, high or very high resolving power for a wide bandwidth in a non-isolated environment.Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; EspañaFil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; ArgentinaFil: Rickenstorff, C.. Universidad Complutense de Madrid; EspañaOptical Society of America2017-11info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/49240Martínez Matos, Ó.; Vaveliuk, Pablo; Rickenstorff, C.; Structured light illumination for order sorting in Echelle spectrometers; Optical Society of America; Optics Express; 25; 24; 11-2017; 30642-306501094-4087CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1364/OE.25.030642info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/abstract.cfm?uri=oe-25-24-30642info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T15:15:16Zoai:ri.conicet.gov.ar:11336/49240instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 15:15:17.211CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Structured light illumination for order sorting in Echelle spectrometers |
title |
Structured light illumination for order sorting in Echelle spectrometers |
spellingShingle |
Structured light illumination for order sorting in Echelle spectrometers Martínez Matos, Ó. Spectrometers Spectrum Analysis Spectrometers And Spectroscopic Instrumentation Interferometry |
title_short |
Structured light illumination for order sorting in Echelle spectrometers |
title_full |
Structured light illumination for order sorting in Echelle spectrometers |
title_fullStr |
Structured light illumination for order sorting in Echelle spectrometers |
title_full_unstemmed |
Structured light illumination for order sorting in Echelle spectrometers |
title_sort |
Structured light illumination for order sorting in Echelle spectrometers |
dc.creator.none.fl_str_mv |
Martínez Matos, Ó. Vaveliuk, Pablo Rickenstorff, C. |
author |
Martínez Matos, Ó. |
author_facet |
Martínez Matos, Ó. Vaveliuk, Pablo Rickenstorff, C. |
author_role |
author |
author2 |
Vaveliuk, Pablo Rickenstorff, C. |
author2_role |
author author |
dc.subject.none.fl_str_mv |
Spectrometers Spectrum Analysis Spectrometers And Spectroscopic Instrumentation Interferometry |
topic |
Spectrometers Spectrum Analysis Spectrometers And Spectroscopic Instrumentation Interferometry |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
We report on the operation of an echelle spectrometer under structured light illumination. Each diffraction order of the spectrometer is encoded with a certain periodic structure allowing for order sorting by numerical analysis after detection. In contrast to cross-dispersed echelle spectrometers, in this approach the orders overlap at the detection plane so that the spectral calibration can be performed easily with a single reference wavelength. This operational simplification makes it possible to measure simultaneously the light source under study and the calibration wavelength giving rise to a self-calibrated echelle spectrometer. In this way the device compensates for the spectral drift due to temporal changes of environmental conditions in real time. Our proposal can be useful in a large number of applications requiring moderate, high or very high resolving power for a wide bandwidth in a non-isolated environment. Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; España Fil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina Fil: Rickenstorff, C.. Universidad Complutense de Madrid; España |
description |
We report on the operation of an echelle spectrometer under structured light illumination. Each diffraction order of the spectrometer is encoded with a certain periodic structure allowing for order sorting by numerical analysis after detection. In contrast to cross-dispersed echelle spectrometers, in this approach the orders overlap at the detection plane so that the spectral calibration can be performed easily with a single reference wavelength. This operational simplification makes it possible to measure simultaneously the light source under study and the calibration wavelength giving rise to a self-calibrated echelle spectrometer. In this way the device compensates for the spectral drift due to temporal changes of environmental conditions in real time. Our proposal can be useful in a large number of applications requiring moderate, high or very high resolving power for a wide bandwidth in a non-isolated environment. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-11 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/49240 Martínez Matos, Ó.; Vaveliuk, Pablo; Rickenstorff, C.; Structured light illumination for order sorting in Echelle spectrometers; Optical Society of America; Optics Express; 25; 24; 11-2017; 30642-30650 1094-4087 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/49240 |
identifier_str_mv |
Martínez Matos, Ó.; Vaveliuk, Pablo; Rickenstorff, C.; Structured light illumination for order sorting in Echelle spectrometers; Optical Society of America; Optics Express; 25; 24; 11-2017; 30642-30650 1094-4087 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1364/OE.25.030642 info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/abstract.cfm?uri=oe-25-24-30642 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Optical Society of America |
publisher.none.fl_str_mv |
Optical Society of America |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1846083300640161792 |
score |
13.22299 |