Cita APA

Shekhter, P., Palumbo, F. R. M., Cohen Weinfeld, K., & Eizenberg, M. (2014). X ray photoelectron analysis of oxide-semiconductor interface after breakdown in Al2O3/InGaAs stacks. Web

Citación estilo Chicago

Shekhter, P., Félix Roberto Mario Palumbo, K. Cohen Weinfeld, and M. Eizenberg. X Ray Photoelectron Analysis of Oxide-semiconductor Interface After Breakdown in Al2O3/InGaAs Stacks. 2014.

Cita MLA

Shekhter, P., Félix Roberto Mario Palumbo, K. Cohen Weinfeld, and M. Eizenberg. X Ray Photoelectron Analysis of Oxide-semiconductor Interface After Breakdown in Al2O3/InGaAs Stacks. 2014.