Cita APA

Ravelli, L., Macchi, C. E., Mariazzi, S., Mazzoldi, P., Egger, W., Hugenschmidt, C., . . . Brusa, R. S. (2015). Interstitial oxygen related defects and nanovoids in Au implanted a-SiO2 glass depth profiled by positron annihilation spectroscopy. Web

Citación estilo Chicago

Ravelli, L., Carlos Eugenio Macchi, S. Mariazzi, P. Mazzoldi, W. Egger, C. Hugenschmidt, Alberto Horacio Somoza, and R. S. Brusa. Interstitial Oxygen Related Defects and Nanovoids in Au Implanted A-SiO2 Glass Depth Profiled By Positron Annihilation Spectroscopy. 2015.

Cita MLA

Ravelli, L., et al. Interstitial Oxygen Related Defects and Nanovoids in Au Implanted A-SiO2 Glass Depth Profiled By Positron Annihilation Spectroscopy. 2015.