Cita APA

Brusa, R. S., Mariazzi, S., Ravelli, L., Mazzoldi, P., Mattei, G., Egger, W., . . . Somoza, A. H. (2010). Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy. Web

Citación estilo Chicago

Brusa, R. S., et al. Study of Defects in Implanted Silica Glass By Depth Profiling Positron Annihilation Spectroscopy. 2010.

Cita MLA

Brusa, R. S., et al. Study of Defects in Implanted Silica Glass By Depth Profiling Positron Annihilation Spectroscopy. 2010.