Cita APA

Palumbo, F. R. M., Winter, R., Tang, K., McIntyre, P. C., & Eizenberg, M. (2017). Investigation of stress induced interface states in Al2O3/InGaAs metal-oxide-semiconductor capacitors. Web

Citación estilo Chicago

Palumbo, Félix Roberto Mario, R. Winter, K. Tang, P. C. McIntyre, and M. Eizenberg. Investigation of Stress Induced Interface States in Al2O3/InGaAs Metal-oxide-semiconductor Capacitors. 2017.

Cita MLA

Palumbo, Félix Roberto Mario, et al. Investigation of Stress Induced Interface States in Al2O3/InGaAs Metal-oxide-semiconductor Capacitors. 2017.