Rubinelli, F. A., & de Greef, M. G. (2015). Simplified method for the evaluation of the reverse dark current-voltage characteristic of thin film devices. Web
Citación estilo ChicagoRubinelli, Francisco Alberto, and Marcelo Gastón de Greef. Simplified Method for the Evaluation of the Reverse Dark Current-voltage Characteristic of Thin Film Devices. 2015.
Cita MLARubinelli, Francisco Alberto, and Marcelo Gastón de Greef. Simplified Method for the Evaluation of the Reverse Dark Current-voltage Characteristic of Thin Film Devices. 2015.
Precaución: Estas citas no son 100% exactas.