Aguirre, F. L., Ranjan, A., Raghavan, N., Padovani, A., Pazos, S. M., Vega, N. A., . . . Palumbo, F. R. M. (2021). Decoupling the sequence of dielectric breakdown in single device bilayer stacks by radiation-controlled, spatially localized creation of oxide defects. Web
Citación estilo ChicagoAguirre, Fernando Leonel, et al. Decoupling the Sequence of Dielectric Breakdown in Single Device Bilayer Stacks By Radiation-controlled, Spatially Localized Creation of Oxide Defects. 2021.
Cita MLAAguirre, Fernando Leonel, et al. Decoupling the Sequence of Dielectric Breakdown in Single Device Bilayer Stacks By Radiation-controlled, Spatially Localized Creation of Oxide Defects. 2021.
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