Cita APA

Pazos, S. M., Aguirre, F. L., Tang, K., McIntyre, P., & Palumbo, F. R. M. (2018). Lack of correlation between C-V hysteresis and capacitance frequency dispersion in accumulation of metal gate/high- k /n-InGaAs metal-oxide-semiconductor stacks. Web

Citación estilo Chicago

Pazos, Sebastián Matías, Fernando Leonel Aguirre, K. Tang, P. McIntyre, and Félix Roberto Mario Palumbo. Lack of Correlation between C-V Hysteresis and Capacitance Frequency Dispersion in Accumulation of Metal Gate/high- K /n-InGaAs Metal-oxide-semiconductor Stacks. 2018.

Cita MLA

Pazos, Sebastián Matías, et al. Lack of Correlation between C-V Hysteresis and Capacitance Frequency Dispersion in Accumulation of Metal Gate/high- K /n-InGaAs Metal-oxide-semiconductor Stacks. 2018.