Cita APA

Boyeras Baldomá, S., Pazos, S. M., Aguirre, F. L., & Palumbo, F. R. M. (2020). Breakdown transients in high-k multilayered MOS stacks: Role of the oxide-oxide thermal boundary resistance. Web

Citación estilo Chicago

Boyeras Baldomá, Santiago, Sebastián Matías Pazos, F. L. Aguirre, and Felix Roberto Mario Palumbo. Breakdown Transients in High-k Multilayered MOS Stacks: Role of the Oxide-oxide Thermal Boundary Resistance. 2020.

Cita MLA

Boyeras Baldomá, Santiago, Sebastián Matías Pazos, F. L. Aguirre, and Felix Roberto Mario Palumbo. Breakdown Transients in High-k Multilayered MOS Stacks: Role of the Oxide-oxide Thermal Boundary Resistance. 2020.