Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)

Autores
Bonetto, Fernando Jose; Vidal, Ricardo Alberto; Quintero Riascos, Vanessa Alexandra; Bonin, Claudio Julio; Ferron, Julio
Año de publicación
2017
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED) and Reflection Electron Energy Loss Spectrometry (REELS) were used to characterize the growth and thermal stability of C60 films deposited on Cu(111). By means of LEED we found that while C60 grows in an ordered fashion up to the first monolayer (ML) at room temperature (RT), it turns amorphous beyond that point. On the other hand, when the substrate temperature is kept at 450K films up to two ML with crystalline structure are obtained. For substrate temperatures beyond 570K thick films (more than 1 ML) do not grow at all. By using AES, we found that a thick C60 film starts to desorb at a temperature around 470K but the first monolayer remains stable up to temperatures as high as 900K. A monolayer with a better crystalline order is obtained after desorption than that growth with the substrate at RT or higher temperatures. When the substrate is heated at 970K, the first monolayer is not fully removed but the C60 molecular structure is altered or molecules break up into smaller pieces. The ion induced damage on C60 on Cu(111) films was studied for typical ions, incoming energies and irradiation doses used in Low Energy Ion Scattering (LEIS) experiments. The D-value of C(KLL) Auger spectra and the -plasmon of REELS, were monitored to characterize the damage caused to the film. We found that, at low doses ( 1014 ions/cm2), damage is only detectable for massive ions like Ar, but not for H and He in the 2-8 keV range.
Fil: Bonetto, Fernando Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; Argentina
Fil: Vidal, Ricardo Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; Argentina
Fil: Quintero Riascos, Vanessa Alexandra. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina
Fil: Bonin, Claudio Julio. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina
Fil: Ferron, Julio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; Argentina
Materia
THERMAL DESORPTION
C60
CU(111)
ION BOMBARDEMENT
AES
REELS
LEED
LEIS
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/38083
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/38083
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)Bonetto, Fernando JoseVidal, Ricardo AlbertoQuintero Riascos, Vanessa AlexandraBonin, Claudio JulioFerron, JulioTHERMAL DESORPTIONC60CU(111)ION BOMBARDEMENTAESREELSLEEDLEIShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED) and Reflection Electron Energy Loss Spectrometry (REELS) were used to characterize the growth and thermal stability of C60 films deposited on Cu(111). By means of LEED we found that while C60 grows in an ordered fashion up to the first monolayer (ML) at room temperature (RT), it turns amorphous beyond that point. On the other hand, when the substrate temperature is kept at 450K films up to two ML with crystalline structure are obtained. For substrate temperatures beyond 570K thick films (more than 1 ML) do not grow at all. By using AES, we found that a thick C60 film starts to desorb at a temperature around 470K but the first monolayer remains stable up to temperatures as high as 900K. A monolayer with a better crystalline order is obtained after desorption than that growth with the substrate at RT or higher temperatures. When the substrate is heated at 970K, the first monolayer is not fully removed but the C60 molecular structure is altered or molecules break up into smaller pieces. The ion induced damage on C60 on Cu(111) films was studied for typical ions, incoming energies and irradiation doses used in Low Energy Ion Scattering (LEIS) experiments. The D-value of C(KLL) Auger spectra and the -plasmon of REELS, were monitored to characterize the damage caused to the film. We found that, at low doses ( 1014 ions/cm2), damage is only detectable for massive ions like Ar, but not for H and He in the 2-8 keV range.Fil: Bonetto, Fernando Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; ArgentinaFil: Vidal, Ricardo Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; ArgentinaFil: Quintero Riascos, Vanessa Alexandra. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; ArgentinaFil: Bonin, Claudio Julio. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; ArgentinaFil: Ferron, Julio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; ArgentinaIOP Publishing2017-09info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/38083Bonetto, Fernando Jose; Vidal, Ricardo Alberto; Quintero Riascos, Vanessa Alexandra; Bonin, Claudio Julio; Ferron, Julio; Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111); IOP Publishing; Journal of Physics Communications; 1; 4; 9-2017; 1-202399-6528CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/2399-6528/aa8f31info:eu-repo/semantics/altIdentifier/doi/10.1088/2399-6528/aa8f31info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:52:50Zoai:ri.conicet.gov.ar:11336/38083instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:52:50.27CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
title Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
spellingShingle Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
Bonetto, Fernando Jose
THERMAL DESORPTION
C60
CU(111)
ION BOMBARDEMENT
AES
REELS
LEED
LEIS
title_short Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
title_full Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
title_fullStr Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
title_full_unstemmed Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
title_sort Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111)
dc.creator.none.fl_str_mv Bonetto, Fernando Jose
Vidal, Ricardo Alberto
Quintero Riascos, Vanessa Alexandra
Bonin, Claudio Julio
Ferron, Julio
author Bonetto, Fernando Jose
author_facet Bonetto, Fernando Jose
Vidal, Ricardo Alberto
Quintero Riascos, Vanessa Alexandra
Bonin, Claudio Julio
Ferron, Julio
author_role author
author2 Vidal, Ricardo Alberto
Quintero Riascos, Vanessa Alexandra
Bonin, Claudio Julio
Ferron, Julio
author2_role author
author
author
author
dc.subject.none.fl_str_mv THERMAL DESORPTION
C60
CU(111)
ION BOMBARDEMENT
AES
REELS
LEED
LEIS
topic THERMAL DESORPTION
C60
CU(111)
ION BOMBARDEMENT
AES
REELS
LEED
LEIS
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED) and Reflection Electron Energy Loss Spectrometry (REELS) were used to characterize the growth and thermal stability of C60 films deposited on Cu(111). By means of LEED we found that while C60 grows in an ordered fashion up to the first monolayer (ML) at room temperature (RT), it turns amorphous beyond that point. On the other hand, when the substrate temperature is kept at 450K films up to two ML with crystalline structure are obtained. For substrate temperatures beyond 570K thick films (more than 1 ML) do not grow at all. By using AES, we found that a thick C60 film starts to desorb at a temperature around 470K but the first monolayer remains stable up to temperatures as high as 900K. A monolayer with a better crystalline order is obtained after desorption than that growth with the substrate at RT or higher temperatures. When the substrate is heated at 970K, the first monolayer is not fully removed but the C60 molecular structure is altered or molecules break up into smaller pieces. The ion induced damage on C60 on Cu(111) films was studied for typical ions, incoming energies and irradiation doses used in Low Energy Ion Scattering (LEIS) experiments. The D-value of C(KLL) Auger spectra and the -plasmon of REELS, were monitored to characterize the damage caused to the film. We found that, at low doses ( 1014 ions/cm2), damage is only detectable for massive ions like Ar, but not for H and He in the 2-8 keV range.
Fil: Bonetto, Fernando Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; Argentina
Fil: Vidal, Ricardo Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; Argentina
Fil: Quintero Riascos, Vanessa Alexandra. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina
Fil: Bonin, Claudio Julio. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina
Fil: Ferron, Julio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Física del Litoral. Universidad Nacional del Litoral. Instituto de Física del Litoral; Argentina. Universidad Nacional del Litoral. Facultad de Ingeniería Química. Departamento de Materiales; Argentina
description Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED) and Reflection Electron Energy Loss Spectrometry (REELS) were used to characterize the growth and thermal stability of C60 films deposited on Cu(111). By means of LEED we found that while C60 grows in an ordered fashion up to the first monolayer (ML) at room temperature (RT), it turns amorphous beyond that point. On the other hand, when the substrate temperature is kept at 450K films up to two ML with crystalline structure are obtained. For substrate temperatures beyond 570K thick films (more than 1 ML) do not grow at all. By using AES, we found that a thick C60 film starts to desorb at a temperature around 470K but the first monolayer remains stable up to temperatures as high as 900K. A monolayer with a better crystalline order is obtained after desorption than that growth with the substrate at RT or higher temperatures. When the substrate is heated at 970K, the first monolayer is not fully removed but the C60 molecular structure is altered or molecules break up into smaller pieces. The ion induced damage on C60 on Cu(111) films was studied for typical ions, incoming energies and irradiation doses used in Low Energy Ion Scattering (LEIS) experiments. The D-value of C(KLL) Auger spectra and the -plasmon of REELS, were monitored to characterize the damage caused to the film. We found that, at low doses ( 1014 ions/cm2), damage is only detectable for massive ions like Ar, but not for H and He in the 2-8 keV range.
publishDate 2017
dc.date.none.fl_str_mv 2017-09
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/38083
Bonetto, Fernando Jose; Vidal, Ricardo Alberto; Quintero Riascos, Vanessa Alexandra; Bonin, Claudio Julio; Ferron, Julio; Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111); IOP Publishing; Journal of Physics Communications; 1; 4; 9-2017; 1-20
2399-6528
CONICET Digital
CONICET
url http://hdl.handle.net/11336/38083
identifier_str_mv Bonetto, Fernando Jose; Vidal, Ricardo Alberto; Quintero Riascos, Vanessa Alexandra; Bonin, Claudio Julio; Ferron, Julio; Growth, thermal desorption and low dose ion bombardment damage of C60 films deposited on Cu(111); IOP Publishing; Journal of Physics Communications; 1; 4; 9-2017; 1-20
2399-6528
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/2399-6528/aa8f31
info:eu-repo/semantics/altIdentifier/doi/10.1088/2399-6528/aa8f31
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv IOP Publishing
publisher.none.fl_str_mv IOP Publishing
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.13397

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