Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?

Autores
Fontoura, Beatriz M.; Cora Jofré, Florencia; Williams, Trey; Savio, Marianela; Donati, George L.; Nóbrega, Joaquim A.
Año de publicación
2022
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Microwave-induced plasma optical emission spectrometry (MIP-OES) has been attracting growing interest since the introduction of a commercial instrument based on a Hammer cavity and resonant iris system (4100 MP-AES, Agilent Technologies) in 2012. During the past few years, important modifications have been made to the instrument to improve its analytical performance, and new models have been launched (4200 and 4210 MP-AES). These improvements, along with other performance studies, allowed for the instrument's use in several applications, with adequate analytical results, which raises the question of whether MIP-OES has positioned itself to become an alternative to the traditional inductively coupled plasma optical emission spectrometry (ICP-OES). In the present review, we describe recent advances in MIP-OES instrumentation and compare the method's figures of merit, as well as its ability to deal with matrix effects, with those typically observed in ICP-OES. We also discuss recent studies and strategies developed to overcome general MIP-OES limitations. Instrument accessories, plasma diagnostics strategies, new calibration methods, and developments in sample preparation and sample introduction are some of the strategies used to improve MIP-OES sensitivity and accuracy. Therefore, the aims of the present work are to identify applications for which MIP-OES has become competitive with ICP-OES, as well as to describe recent developments that contributed to MIP-OES' acceptance as a cost-effective alternative for trace element analysis.
Fil: Fontoura, Beatriz M.. Universidade Federal do São Carlos; Brasil
Fil: Cora Jofré, Florencia. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; Argentina
Fil: Williams, Trey. CLEMSON UNIVERSITY (CLEMSON UNIVERSITY);
Fil: Savio, Marianela. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; Argentina
Fil: Donati, George L.. University Wake Forest; Estados Unidos
Fil: Nóbrega, Joaquim A.. Universidade Federal do São Carlos; Brasil
Materia
MIPOES
ICPOES
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/213258

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network_name_str CONICET Digital (CONICET)
spelling Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?Fontoura, Beatriz M.Cora Jofré, FlorenciaWilliams, TreySavio, MarianelaDonati, George L.Nóbrega, Joaquim A.MIPOESICPOEShttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1Microwave-induced plasma optical emission spectrometry (MIP-OES) has been attracting growing interest since the introduction of a commercial instrument based on a Hammer cavity and resonant iris system (4100 MP-AES, Agilent Technologies) in 2012. During the past few years, important modifications have been made to the instrument to improve its analytical performance, and new models have been launched (4200 and 4210 MP-AES). These improvements, along with other performance studies, allowed for the instrument's use in several applications, with adequate analytical results, which raises the question of whether MIP-OES has positioned itself to become an alternative to the traditional inductively coupled plasma optical emission spectrometry (ICP-OES). In the present review, we describe recent advances in MIP-OES instrumentation and compare the method's figures of merit, as well as its ability to deal with matrix effects, with those typically observed in ICP-OES. We also discuss recent studies and strategies developed to overcome general MIP-OES limitations. Instrument accessories, plasma diagnostics strategies, new calibration methods, and developments in sample preparation and sample introduction are some of the strategies used to improve MIP-OES sensitivity and accuracy. Therefore, the aims of the present work are to identify applications for which MIP-OES has become competitive with ICP-OES, as well as to describe recent developments that contributed to MIP-OES' acceptance as a cost-effective alternative for trace element analysis.Fil: Fontoura, Beatriz M.. Universidade Federal do São Carlos; BrasilFil: Cora Jofré, Florencia. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; ArgentinaFil: Williams, Trey. CLEMSON UNIVERSITY (CLEMSON UNIVERSITY);Fil: Savio, Marianela. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; ArgentinaFil: Donati, George L.. University Wake Forest; Estados UnidosFil: Nóbrega, Joaquim A.. Universidade Federal do São Carlos; BrasilRoyal Society of Chemistry2022-04info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/213258Fontoura, Beatriz M.; Cora Jofré, Florencia; Williams, Trey; Savio, Marianela; Donati, George L.; et al.; Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 4-2022; 1-190267-9477CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://xlink.rsc.org/?DOI=D1JA00375Einfo:eu-repo/semantics/altIdentifier/doi/10.1039/D1JA00375Einfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:55:21Zoai:ri.conicet.gov.ar:11336/213258instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:55:22.168CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
title Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
spellingShingle Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
Fontoura, Beatriz M.
MIPOES
ICPOES
title_short Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
title_full Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
title_fullStr Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
title_full_unstemmed Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
title_sort Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
dc.creator.none.fl_str_mv Fontoura, Beatriz M.
Cora Jofré, Florencia
Williams, Trey
Savio, Marianela
Donati, George L.
Nóbrega, Joaquim A.
author Fontoura, Beatriz M.
author_facet Fontoura, Beatriz M.
Cora Jofré, Florencia
Williams, Trey
Savio, Marianela
Donati, George L.
Nóbrega, Joaquim A.
author_role author
author2 Cora Jofré, Florencia
Williams, Trey
Savio, Marianela
Donati, George L.
Nóbrega, Joaquim A.
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv MIPOES
ICPOES
topic MIPOES
ICPOES
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Microwave-induced plasma optical emission spectrometry (MIP-OES) has been attracting growing interest since the introduction of a commercial instrument based on a Hammer cavity and resonant iris system (4100 MP-AES, Agilent Technologies) in 2012. During the past few years, important modifications have been made to the instrument to improve its analytical performance, and new models have been launched (4200 and 4210 MP-AES). These improvements, along with other performance studies, allowed for the instrument's use in several applications, with adequate analytical results, which raises the question of whether MIP-OES has positioned itself to become an alternative to the traditional inductively coupled plasma optical emission spectrometry (ICP-OES). In the present review, we describe recent advances in MIP-OES instrumentation and compare the method's figures of merit, as well as its ability to deal with matrix effects, with those typically observed in ICP-OES. We also discuss recent studies and strategies developed to overcome general MIP-OES limitations. Instrument accessories, plasma diagnostics strategies, new calibration methods, and developments in sample preparation and sample introduction are some of the strategies used to improve MIP-OES sensitivity and accuracy. Therefore, the aims of the present work are to identify applications for which MIP-OES has become competitive with ICP-OES, as well as to describe recent developments that contributed to MIP-OES' acceptance as a cost-effective alternative for trace element analysis.
Fil: Fontoura, Beatriz M.. Universidade Federal do São Carlos; Brasil
Fil: Cora Jofré, Florencia. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; Argentina
Fil: Williams, Trey. CLEMSON UNIVERSITY (CLEMSON UNIVERSITY);
Fil: Savio, Marianela. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Ciencias de la Tierra y Ambientales de La Pampa. Universidad Nacional de La Pampa. Facultad de Ciencias Exactas y Naturales. Instituto de Ciencias de la Tierra y Ambientales de La Pampa; Argentina
Fil: Donati, George L.. University Wake Forest; Estados Unidos
Fil: Nóbrega, Joaquim A.. Universidade Federal do São Carlos; Brasil
description Microwave-induced plasma optical emission spectrometry (MIP-OES) has been attracting growing interest since the introduction of a commercial instrument based on a Hammer cavity and resonant iris system (4100 MP-AES, Agilent Technologies) in 2012. During the past few years, important modifications have been made to the instrument to improve its analytical performance, and new models have been launched (4200 and 4210 MP-AES). These improvements, along with other performance studies, allowed for the instrument's use in several applications, with adequate analytical results, which raises the question of whether MIP-OES has positioned itself to become an alternative to the traditional inductively coupled plasma optical emission spectrometry (ICP-OES). In the present review, we describe recent advances in MIP-OES instrumentation and compare the method's figures of merit, as well as its ability to deal with matrix effects, with those typically observed in ICP-OES. We also discuss recent studies and strategies developed to overcome general MIP-OES limitations. Instrument accessories, plasma diagnostics strategies, new calibration methods, and developments in sample preparation and sample introduction are some of the strategies used to improve MIP-OES sensitivity and accuracy. Therefore, the aims of the present work are to identify applications for which MIP-OES has become competitive with ICP-OES, as well as to describe recent developments that contributed to MIP-OES' acceptance as a cost-effective alternative for trace element analysis.
publishDate 2022
dc.date.none.fl_str_mv 2022-04
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/213258
Fontoura, Beatriz M.; Cora Jofré, Florencia; Williams, Trey; Savio, Marianela; Donati, George L.; et al.; Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 4-2022; 1-19
0267-9477
CONICET Digital
CONICET
url http://hdl.handle.net/11336/213258
identifier_str_mv Fontoura, Beatriz M.; Cora Jofré, Florencia; Williams, Trey; Savio, Marianela; Donati, George L.; et al.; Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 4-2022; 1-19
0267-9477
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://xlink.rsc.org/?DOI=D1JA00375E
info:eu-repo/semantics/altIdentifier/doi/10.1039/D1JA00375E
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Royal Society of Chemistry
publisher.none.fl_str_mv Royal Society of Chemistry
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
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instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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