Cita APA

Palumbo, F. R. M., Winter, R., Krylov, I., & Eizenberg, M. (2014). Characteristics of stress-induced defects under positive bias in high-k/InGaAs stacks. Web

Citación estilo Chicago

Palumbo, Félix Roberto Mario, R. Winter, I. Krylov, and M. Eizenberg. Characteristics of Stress-induced Defects Under Positive Bias in High-k/InGaAs Stacks. 2014.

Cita MLA

Palumbo, Félix Roberto Mario, R. Winter, I. Krylov, and M. Eizenberg. Characteristics of Stress-induced Defects Under Positive Bias in High-k/InGaAs Stacks. 2014.