Hidden grids, moiré patterns and optoelectronically measurement of distances

Autores
Garavaglia, Mario José; Laquidara, Anibal Pablo
Año de publicación
1999
Idioma
inglés
Tipo de recurso
documento de conferencia
Estado
versión publicada
Descripción
Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.
Facultad de Ciencias Exactas
Facultad de Ingeniería
Materia
Física
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by/4.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/80396
Acceder
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oai_identifier_str oai:sedici.unlp.edu.ar:10915/80396
network_acronym_str SEDICI
repository_id_str 1329
network_name_str SEDICI (UNLP)
spelling Hidden grids, moiré patterns and optoelectronically measurement of distancesGaravaglia, Mario JoséLaquidara, Anibal PabloFísicaphotocopier hidden gridsCCD hidden gridsmoire effectdistance measurementHidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.Facultad de Ciencias ExactasFacultad de Ingeniería1999info:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionObjeto de conferenciahttp://purl.org/coar/resource_type/c_5794info:ar-repo/semantics/documentoDeConferenciaapplication/pdf188-192http://sedici.unlp.edu.ar/handle/10915/80396enginfo:eu-repo/semantics/altIdentifier/hdl/11746/1146info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by/4.0/Creative Commons Attribution 4.0 International (CC BY 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-29T11:14:47Zoai:sedici.unlp.edu.ar:10915/80396Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-29 11:14:47.913SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv Hidden grids, moiré patterns and optoelectronically measurement of distances
title Hidden grids, moiré patterns and optoelectronically measurement of distances
spellingShingle Hidden grids, moiré patterns and optoelectronically measurement of distances
Garavaglia, Mario José
Física
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
title_short Hidden grids, moiré patterns and optoelectronically measurement of distances
title_full Hidden grids, moiré patterns and optoelectronically measurement of distances
title_fullStr Hidden grids, moiré patterns and optoelectronically measurement of distances
title_full_unstemmed Hidden grids, moiré patterns and optoelectronically measurement of distances
title_sort Hidden grids, moiré patterns and optoelectronically measurement of distances
dc.creator.none.fl_str_mv Garavaglia, Mario José
Laquidara, Anibal Pablo
author Garavaglia, Mario José
author_facet Garavaglia, Mario José
Laquidara, Anibal Pablo
author_role author
author2 Laquidara, Anibal Pablo
author2_role author
dc.subject.none.fl_str_mv Física
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
topic Física
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
dc.description.none.fl_txt_mv Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.
Facultad de Ciencias Exactas
Facultad de Ingeniería
description Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.
publishDate 1999
dc.date.none.fl_str_mv 1999
dc.type.none.fl_str_mv info:eu-repo/semantics/conferenceObject
info:eu-repo/semantics/publishedVersion
Objeto de conferencia
http://purl.org/coar/resource_type/c_5794
info:ar-repo/semantics/documentoDeConferencia
format conferenceObject
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/80396
url http://sedici.unlp.edu.ar/handle/10915/80396
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/hdl/11746/1146
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by/4.0/
Creative Commons Attribution 4.0 International (CC BY 4.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by/4.0/
Creative Commons Attribution 4.0 International (CC BY 4.0)
dc.format.none.fl_str_mv application/pdf
188-192
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
instacron_str UNLP
institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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score 13.070432

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