Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks

Autores
Galván Josa, V.; Fracchia, D.; Castellano, G.; Crespo, E.; Kang, Kyung Won; Bonetto, Rita Dominga
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.
Facultad de Ingeniería (FI)
Laboratorio de Investigaciones de Metalurgia Física (LIMF)
Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA)
Materia
Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-sa/4.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/80682

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network_name_str SEDICI (UNLP)
spelling Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocksGalván Josa, V.Fracchia, D.Castellano, G.Crespo, E.Kang, Kyung WonBonetto, Rita DomingaIngenieríaBackscattered electron imagingX-ray mapsplagioclase zoningZoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.Facultad de Ingeniería (FI)Laboratorio de Investigaciones de Metalurgia Física (LIMF)Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA)2013info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf50-58http://sedici.unlp.edu.ar/handle/10915/80682enginfo:eu-repo/semantics/altIdentifier/issn/0584-8547info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sab.2013.01.001info:eu-repo/semantics/altIdentifier/hdl/11746/9180info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-10-15T11:06:48Zoai:sedici.unlp.edu.ar:10915/80682Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-10-15 11:06:48.654SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
spellingShingle Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
Galván Josa, V.
Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
title_short Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_full Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_fullStr Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_full_unstemmed Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_sort Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
dc.creator.none.fl_str_mv Galván Josa, V.
Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
author Galván Josa, V.
author_facet Galván Josa, V.
Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
author_role author
author2 Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
topic Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
dc.description.none.fl_txt_mv Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.
Facultad de Ingeniería (FI)
Laboratorio de Investigaciones de Metalurgia Física (LIMF)
Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA)
description Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.
publishDate 2013
dc.date.none.fl_str_mv 2013
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Articulo
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/80682
url http://sedici.unlp.edu.ar/handle/10915/80682
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/issn/0584-8547
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sab.2013.01.001
info:eu-repo/semantics/altIdentifier/hdl/11746/9180
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
dc.format.none.fl_str_mv application/pdf
50-58
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
instacron_str UNLP
institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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