Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
- Autores
- Galván Josa, V.; Fracchia, D.; Castellano, G.; Crespo, E.; Kang, Kyung Won; Bonetto, Rita Dominga
- Año de publicación
- 2013
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.
Facultad de Ingeniería (FI)
Laboratorio de Investigaciones de Metalurgia Física (LIMF)
Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA) - Materia
-
Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- http://creativecommons.org/licenses/by-nc-sa/4.0/
- Repositorio
- Institución
- Universidad Nacional de La Plata
- OAI Identificador
- oai:sedici.unlp.edu.ar:10915/80682
Ver los metadatos del registro completo
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Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocksGalván Josa, V.Fracchia, D.Castellano, G.Crespo, E.Kang, Kyung WonBonetto, Rita DomingaIngenieríaBackscattered electron imagingX-ray mapsplagioclase zoningZoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.Facultad de Ingeniería (FI)Laboratorio de Investigaciones de Metalurgia Física (LIMF)Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA)2013info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf50-58http://sedici.unlp.edu.ar/handle/10915/80682enginfo:eu-repo/semantics/altIdentifier/issn/0584-8547info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sab.2013.01.001info:eu-repo/semantics/altIdentifier/hdl/11746/9180info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-10-15T11:06:48Zoai:sedici.unlp.edu.ar:10915/80682Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-10-15 11:06:48.654SEDICI (UNLP) - Universidad Nacional de La Platafalse |
dc.title.none.fl_str_mv |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
title |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
spellingShingle |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks Galván Josa, V. Ingeniería Backscattered electron imaging X-ray maps plagioclase zoning |
title_short |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
title_full |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
title_fullStr |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
title_full_unstemmed |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
title_sort |
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks |
dc.creator.none.fl_str_mv |
Galván Josa, V. Fracchia, D. Castellano, G. Crespo, E. Kang, Kyung Won Bonetto, Rita Dominga |
author |
Galván Josa, V. |
author_facet |
Galván Josa, V. Fracchia, D. Castellano, G. Crespo, E. Kang, Kyung Won Bonetto, Rita Dominga |
author_role |
author |
author2 |
Fracchia, D. Castellano, G. Crespo, E. Kang, Kyung Won Bonetto, Rita Dominga |
author2_role |
author author author author author |
dc.subject.none.fl_str_mv |
Ingeniería Backscattered electron imaging X-ray maps plagioclase zoning |
topic |
Ingeniería Backscattered electron imaging X-ray maps plagioclase zoning |
dc.description.none.fl_txt_mv |
Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points. Facultad de Ingeniería (FI) Laboratorio de Investigaciones de Metalurgia Física (LIMF) Centro de Investigación y Desarrollo en Ciencias Aplicadas (CINDECA) |
description |
Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Articulo http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
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publishedVersion |
dc.identifier.none.fl_str_mv |
http://sedici.unlp.edu.ar/handle/10915/80682 |
url |
http://sedici.unlp.edu.ar/handle/10915/80682 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/issn/0584-8547 info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sab.2013.01.001 info:eu-repo/semantics/altIdentifier/hdl/11746/9180 |
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openAccess |
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http://creativecommons.org/licenses/by-nc-sa/4.0/ Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) |
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