Sanchez, E. Y., Represa, N. S., Mellado, D., Balbi, K. B., Acquesta, A. D., Colman Lerner, J. E., & Porta, A. A. (2018). Risk analysis of technological hazards: Simulation of scenarios and application of a local vulnerability index. Web
Citación estilo ChicagoSanchez, Erica Yanina, Natacha Soledad Represa, Daniela Mellado, Karina Beatriz Balbi, A. D. Acquesta, Jorge Esteban Colman Lerner, and Atilio Andrés Porta. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. 2018.
Cita MLASanchez, Erica Yanina, et al. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. 2018.
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