Ellipsometry and electron diffraction study of anodically formed Pd oxide layer

Autores
Bolzán, Agustín Eduardo; Zerbino, Jorge Omar; Macchi, E.; Arvia, Alejandro Jorge
Año de publicación
1993
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Anodic Pd oxide films grown in l M H2SO4 and l M HClO4 during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential Eτ(1.90 V ⩽ Eτ ⩽ 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10–20nm, depending on the solution composition.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
Materia
Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-sa/4.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/120775
Acceder
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oai_identifier_str oai:sedici.unlp.edu.ar:10915/120775
network_acronym_str SEDICI
repository_id_str 1329
network_name_str SEDICI (UNLP)
spelling Ellipsometry and electron diffraction study of anodically formed Pd oxide layerBolzán, Agustín EduardoZerbino, Jorge OmarMacchi, E.Arvia, Alejandro JorgeCiencias ExactasQuímicaPd oxide layersElectrochemistryAnodic Pd oxide films grown in l M H<sub>2</sub>SO<sub>4</sub> and l M HClO<sub>4</sub> during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential E<sub>τ</sub>(1.90 V ⩽ E<sub>τ</sub> ⩽ 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10–20nm, depending on the solution composition.Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas1993info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf77-81http://sedici.unlp.edu.ar/handle/10915/120775enginfo:eu-repo/semantics/altIdentifier/issn/0040-6090info:eu-repo/semantics/altIdentifier/doi/10.1016/0040-6090(93)90065-Winfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-10-22T17:09:29Zoai:sedici.unlp.edu.ar:10915/120775Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-10-22 17:09:30.047SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
spellingShingle Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
Bolzán, Agustín Eduardo
Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
title_short Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_full Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_fullStr Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_full_unstemmed Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_sort Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
dc.creator.none.fl_str_mv Bolzán, Agustín Eduardo
Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
author Bolzán, Agustín Eduardo
author_facet Bolzán, Agustín Eduardo
Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
author_role author
author2 Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
author2_role author
author
author
dc.subject.none.fl_str_mv Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
topic Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
dc.description.none.fl_txt_mv Anodic Pd oxide films grown in l M H<sub>2</sub>SO<sub>4</sub> and l M HClO<sub>4</sub> during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential E<sub>τ</sub>(1.90 V ⩽ E<sub>τ</sub> ⩽ 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10–20nm, depending on the solution composition.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
description Anodic Pd oxide films grown in l M H<sub>2</sub>SO<sub>4</sub> and l M HClO<sub>4</sub> during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential E<sub>τ</sub>(1.90 V ⩽ E<sub>τ</sub> ⩽ 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10–20nm, depending on the solution composition.
publishDate 1993
dc.date.none.fl_str_mv 1993
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Articulo
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/120775
url http://sedici.unlp.edu.ar/handle/10915/120775
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/issn/0040-6090
info:eu-repo/semantics/altIdentifier/doi/10.1016/0040-6090(93)90065-W
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
dc.format.none.fl_str_mv application/pdf
77-81
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
instacron_str UNLP
institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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score 12.982451

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