Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles

Autores
Seré, Pablo Ricardo; Zerbino, Jorge Omar; Maltz, Alberto Leonardo; Elsner, Cecilia Inés; Di Sarli, Alejandro Ramón
Año de publicación
2016
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
Centro de Investigación y Desarrollo en Tecnología de Pinturas
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
Materia
Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-nd/4.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/81500
Acceder
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oai_identifier_str oai:sedici.unlp.edu.ar:10915/81500
network_acronym_str SEDICI
repository_id_str 1329
network_name_str SEDICI (UNLP)
spelling Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence anglesSeré, Pablo RicardoZerbino, Jorge OmarMaltz, Alberto LeonardoElsner, Cecilia InésDi Sarli, Alejandro RamónIngeniería QuímicaMercaptopropyltrimethoxysilaneEllipsometryAnticorrosive coatingOptical constantsFilms of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.Centro de Investigación y Desarrollo en Tecnología de PinturasInstituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas2016info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf109-118http://sedici.unlp.edu.ar/handle/10915/81500enginfo:eu-repo/semantics/altIdentifier/issn/2320-1975info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0/Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-10-22T16:55:56Zoai:sedici.unlp.edu.ar:10915/81500Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-10-22 16:55:56.938SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
spellingShingle Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
Seré, Pablo Ricardo
Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
title_short Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_full Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_fullStr Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_full_unstemmed Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_sort Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
dc.creator.none.fl_str_mv Seré, Pablo Ricardo
Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
author Seré, Pablo Ricardo
author_facet Seré, Pablo Ricardo
Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
author_role author
author2 Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
author2_role author
author
author
author
dc.subject.none.fl_str_mv Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
topic Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
dc.description.none.fl_txt_mv Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
Centro de Investigación y Desarrollo en Tecnología de Pinturas
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
description Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
publishDate 2016
dc.date.none.fl_str_mv 2016
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Articulo
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/81500
url http://sedici.unlp.edu.ar/handle/10915/81500
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/issn/2320-1975
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/4.0/
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)
dc.format.none.fl_str_mv application/pdf
109-118
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
instacron_str UNLP
institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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score 12.982451

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