Cita APA

Belcher, A., Williams, J., Ireland, J., Iuzzolino, R., Bierzychudek, M. E., Dekker, R., . . . Schaapman, K. (2018). Towards a metrology class ADC based on Josephson junction devices. Web

Citación estilo Chicago

Belcher, A., J. Williams, J. Ireland, R. Iuzzolino, M. E. Bierzychudek, R. Dekker, J. Herick, R. Behr, and K. Schaapman. Towards a Metrology Class ADC Based On Josephson Junction Devices. 2018.

Cita MLA

Belcher, A., et al. Towards a Metrology Class ADC Based On Josephson Junction Devices. 2018.