Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy

Autores
Scarpettini, Alberto; Bragas, Andrea Veronica
Año de publicación
2015
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Field enhanced scanning optical microscopy (FESOM) relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near field information recorded in a FESOM experiment, has to surpass the background light, always present due multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n+1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth-derivative of the near field scattering, amplified by the interferometric background. By modeling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with FESOM.
Fil: Universidad Tecnológica Nacional. Facultad Regional Delta
Peer Reviewed
Materia
UTN
FRD
FESOM
scanning optical microscopy
Plasmonic
harmonic demodulation
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-nd/4.0/
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/3752

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network_name_str Repositorio Institucional Abierto (UTN)
spelling Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopyScarpettini, AlbertoBragas, Andrea VeronicaUTNFRDFESOMscanning optical microscopyPlasmonicharmonic demodulationField enhanced scanning optical microscopy (FESOM) relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near field information recorded in a FESOM experiment, has to surpass the background light, always present due multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n+1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth-derivative of the near field scattering, amplified by the interferometric background. By modeling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with FESOM.Fil: Universidad Tecnológica Nacional. Facultad Regional DeltaPeer Reviewed2019-06-28T18:46:36Z2019-06-28T18:46:36Z2015-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfHarmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy; Wiley Blackwell Publishing, Inc; Journal Of Microscopy-oxford; 257; 1-2015; 54-64 Scarpettini, Alberto Franco; Bragas, Andrea Veronicahttp://hdl.handle.net/20.500.12272/375210.1111/jmi.12185enginfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0/Scarpettini, AlbertoAtribución (by)ScAttribution-NonCommercial-NoDerivatives 4.0 Internacionalreponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacional2025-10-16T10:10:41Zoai:ria.utn.edu.ar:20.500.12272/3752instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2025-10-16 10:10:41.91Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
spellingShingle Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
Scarpettini, Alberto
UTN
FRD
FESOM
scanning optical microscopy
Plasmonic
harmonic demodulation
title_short Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_fullStr Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full_unstemmed Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_sort Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
dc.creator.none.fl_str_mv Scarpettini, Alberto
Bragas, Andrea Veronica
author Scarpettini, Alberto
author_facet Scarpettini, Alberto
Bragas, Andrea Veronica
author_role author
author2 Bragas, Andrea Veronica
author2_role author
dc.subject.none.fl_str_mv UTN
FRD
FESOM
scanning optical microscopy
Plasmonic
harmonic demodulation
topic UTN
FRD
FESOM
scanning optical microscopy
Plasmonic
harmonic demodulation
dc.description.none.fl_txt_mv Field enhanced scanning optical microscopy (FESOM) relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near field information recorded in a FESOM experiment, has to surpass the background light, always present due multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n+1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth-derivative of the near field scattering, amplified by the interferometric background. By modeling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with FESOM.
Fil: Universidad Tecnológica Nacional. Facultad Regional Delta
Peer Reviewed
description Field enhanced scanning optical microscopy (FESOM) relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near field information recorded in a FESOM experiment, has to surpass the background light, always present due multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n+1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth-derivative of the near field scattering, amplified by the interferometric background. By modeling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with FESOM.
publishDate 2015
dc.date.none.fl_str_mv 2015-01
2019-06-28T18:46:36Z
2019-06-28T18:46:36Z
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy; Wiley Blackwell Publishing, Inc; Journal Of Microscopy-oxford; 257; 1-2015; 54-64 Scarpettini, Alberto Franco; Bragas, Andrea Veronica
http://hdl.handle.net/20.500.12272/3752
10.1111/jmi.12185
identifier_str_mv Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy; Wiley Blackwell Publishing, Inc; Journal Of Microscopy-oxford; 257; 1-2015; 54-64 Scarpettini, Alberto Franco; Bragas, Andrea Veronica
10.1111/jmi.12185
url http://hdl.handle.net/20.500.12272/3752
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
Scarpettini, Alberto
Atribución (by)Sc
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/4.0/
Scarpettini, Alberto
Atribución (by)Sc
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.source.none.fl_str_mv reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
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score 12.712165