Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
- Autores
- Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.
Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Bennun, Leonardo Daniel. Universidad de Concepción; Chile
Fil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; Venezuela - Materia
-
Txrf
Pinus Insigne Dougl - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
.jpg)
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/37113
Ver los metadatos del registro completo
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Quantification and characterization of Si in Pinus Insignis Dougl by TXRFNavarro Fernández, Henry LucianoBennun, Leonardo DanielMarcó, Lué M.TxrfPinus Insigne Douglhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Bennun, Leonardo Daniel. Universidad de Concepción; ChileFil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; VenezuelaSpringer2014-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/37113Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-15000947-8396CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1007/s00339-014-8915-0info:eu-repo/semantics/altIdentifier/url/https://link.springer.com/article/10.1007%2Fs00339-014-8915-0info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:14:54Zoai:ri.conicet.gov.ar:11336/37113instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:14:54.538CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
| dc.title.none.fl_str_mv |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| title |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| spellingShingle |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF Navarro Fernández, Henry Luciano Txrf Pinus Insigne Dougl |
| title_short |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| title_full |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| title_fullStr |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| title_full_unstemmed |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| title_sort |
Quantification and characterization of Si in Pinus Insignis Dougl by TXRF |
| dc.creator.none.fl_str_mv |
Navarro Fernández, Henry Luciano Bennun, Leonardo Daniel Marcó, Lué M. |
| author |
Navarro Fernández, Henry Luciano |
| author_facet |
Navarro Fernández, Henry Luciano Bennun, Leonardo Daniel Marcó, Lué M. |
| author_role |
author |
| author2 |
Bennun, Leonardo Daniel Marcó, Lué M. |
| author2_role |
author author |
| dc.subject.none.fl_str_mv |
Txrf Pinus Insigne Dougl |
| topic |
Txrf Pinus Insigne Dougl |
| purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| dc.description.none.fl_txt_mv |
A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg. Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: Bennun, Leonardo Daniel. Universidad de Concepción; Chile Fil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; Venezuela |
| description |
A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg. |
| publishDate |
2014 |
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2014-12 |
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info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
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article |
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publishedVersion |
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http://hdl.handle.net/11336/37113 Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-1500 0947-8396 CONICET Digital CONICET |
| url |
http://hdl.handle.net/11336/37113 |
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Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-1500 0947-8396 CONICET Digital CONICET |
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eng |
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eng |
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