Quantification and characterization of Si in Pinus Insignis Dougl by TXRF

Autores
Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.
Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Bennun, Leonardo Daniel. Universidad de Concepción; Chile
Fil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; Venezuela
Materia
Txrf
Pinus Insigne Dougl
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/37113
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/37113
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Quantification and characterization of Si in Pinus Insignis Dougl by TXRFNavarro Fernández, Henry LucianoBennun, Leonardo DanielMarcó, Lué M.TxrfPinus Insigne Douglhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Bennun, Leonardo Daniel. Universidad de Concepción; ChileFil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; VenezuelaSpringer2014-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/37113Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-15000947-8396CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1007/s00339-014-8915-0info:eu-repo/semantics/altIdentifier/url/https://link.springer.com/article/10.1007%2Fs00339-014-8915-0info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:14:54Zoai:ri.conicet.gov.ar:11336/37113instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:14:54.538CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
title Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
spellingShingle Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
Navarro Fernández, Henry Luciano
Txrf
Pinus Insigne Dougl
title_short Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
title_full Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
title_fullStr Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
title_full_unstemmed Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
title_sort Quantification and characterization of Si in Pinus Insignis Dougl by TXRF
dc.creator.none.fl_str_mv Navarro Fernández, Henry Luciano
Bennun, Leonardo Daniel
Marcó, Lué M.
author Navarro Fernández, Henry Luciano
author_facet Navarro Fernández, Henry Luciano
Bennun, Leonardo Daniel
Marcó, Lué M.
author_role author
author2 Bennun, Leonardo Daniel
Marcó, Lué M.
author2_role author
author
dc.subject.none.fl_str_mv Txrf
Pinus Insigne Dougl
topic Txrf
Pinus Insigne Dougl
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.
Fil: Navarro Fernández, Henry Luciano. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Bennun, Leonardo Daniel. Universidad de Concepción; Chile
Fil: Marcó, Lué M.. Universidad Centro Lisandro Alvarado; Venezuela
description A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.
publishDate 2014
dc.date.none.fl_str_mv 2014-12
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/37113
Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-1500
0947-8396
CONICET Digital
CONICET
url http://hdl.handle.net/11336/37113
identifier_str_mv Navarro Fernández, Henry Luciano; Bennun, Leonardo Daniel; Marcó, Lué M.; Quantification and characterization of Si in Pinus Insignis Dougl by TXRF; Springer; Applied Physics A: Materials Science and Processing; 118; 4; 12-2014; 1495-1500
0947-8396
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1007/s00339-014-8915-0
info:eu-repo/semantics/altIdentifier/url/https://link.springer.com/article/10.1007%2Fs00339-014-8915-0
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Springer
publisher.none.fl_str_mv Springer
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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