Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition
- Autores
- Villafuerte, Manuel Jose; Bridoux, German; Heluani S. P.; Tirado, Monica Cecilia; Grosse, Constantino
- Año de publicación
- 2010
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Electric behavior of polycrystalline La 0.5 Ca 0.5 MnO 3 thin films, pulsed laser deposited on a (100) silicon substrate, is reported and discussed. An electrically induced metal-insulating transition around 150 K is found, which is voltage and thickness dependent. At low temperatures, the film conductivity is non-Ohmic and moderate electric fields lead to resistivity switching towards metaestable low-resistive states. Impedance spectroscopy measurements were also performed in order to determine the film dielectric permittivity and conductivity and to estimate the characteristic metal-semiconductor interface parameters. The obtained results show that the fraction of ferromagnetic metallic regions does not change when a voltage is applied, and that the mechanism responsible for the low temperature metal insulator transition and the conduction behavior is the appearance of connective paths due to the enhanced mobility of carriers activated by the electric field.
Fil: Villafuerte, Manuel Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina
Fil: Bridoux, German. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina
Fil: Heluani S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina
Fil: Tirado, Monica Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; Argentina
Fil: Grosse, Constantino. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; Argentina - Materia
-
MANGANITE
METAL-INSULATOR
IMPEDANCE SPECTROSCOPY - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
.jpg)
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/279370
Ver los metadatos del registro completo
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Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transitionVillafuerte, Manuel JoseBridoux, GermanHeluani S. P.Tirado, Monica CeciliaGrosse, ConstantinoMANGANITEMETAL-INSULATORIMPEDANCE SPECTROSCOPYhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Electric behavior of polycrystalline La 0.5 Ca 0.5 MnO 3 thin films, pulsed laser deposited on a (100) silicon substrate, is reported and discussed. An electrically induced metal-insulating transition around 150 K is found, which is voltage and thickness dependent. At low temperatures, the film conductivity is non-Ohmic and moderate electric fields lead to resistivity switching towards metaestable low-resistive states. Impedance spectroscopy measurements were also performed in order to determine the film dielectric permittivity and conductivity and to estimate the characteristic metal-semiconductor interface parameters. The obtained results show that the fraction of ferromagnetic metallic regions does not change when a voltage is applied, and that the mechanism responsible for the low temperature metal insulator transition and the conduction behavior is the appearance of connective paths due to the enhanced mobility of carriers activated by the electric field.Fil: Villafuerte, Manuel Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; ArgentinaFil: Bridoux, German. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; ArgentinaFil: Heluani S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; ArgentinaFil: Tirado, Monica Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; ArgentinaFil: Grosse, Constantino. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; ArgentinaElsevier Science SA2010-02info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/279370Villafuerte, Manuel Jose; Bridoux, German; Heluani S. P.; Tirado, Monica Cecilia; Grosse, Constantino; Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition; Elsevier Science SA; Thin Solid Films; 518; 8; 2-2010; 2261-22650040-6090CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S004060900901284Xinfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.tsf.2009.07.149info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2026-02-26T10:31:27Zoai:ri.conicet.gov.ar:11336/279370instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982026-02-26 10:31:27.732CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
| dc.title.none.fl_str_mv |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| title |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| spellingShingle |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition Villafuerte, Manuel Jose MANGANITE METAL-INSULATOR IMPEDANCE SPECTROSCOPY |
| title_short |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| title_full |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| title_fullStr |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| title_full_unstemmed |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| title_sort |
Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition |
| dc.creator.none.fl_str_mv |
Villafuerte, Manuel Jose Bridoux, German Heluani S. P. Tirado, Monica Cecilia Grosse, Constantino |
| author |
Villafuerte, Manuel Jose |
| author_facet |
Villafuerte, Manuel Jose Bridoux, German Heluani S. P. Tirado, Monica Cecilia Grosse, Constantino |
| author_role |
author |
| author2 |
Bridoux, German Heluani S. P. Tirado, Monica Cecilia Grosse, Constantino |
| author2_role |
author author author author |
| dc.subject.none.fl_str_mv |
MANGANITE METAL-INSULATOR IMPEDANCE SPECTROSCOPY |
| topic |
MANGANITE METAL-INSULATOR IMPEDANCE SPECTROSCOPY |
| purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| dc.description.none.fl_txt_mv |
Electric behavior of polycrystalline La 0.5 Ca 0.5 MnO 3 thin films, pulsed laser deposited on a (100) silicon substrate, is reported and discussed. An electrically induced metal-insulating transition around 150 K is found, which is voltage and thickness dependent. At low temperatures, the film conductivity is non-Ohmic and moderate electric fields lead to resistivity switching towards metaestable low-resistive states. Impedance spectroscopy measurements were also performed in order to determine the film dielectric permittivity and conductivity and to estimate the characteristic metal-semiconductor interface parameters. The obtained results show that the fraction of ferromagnetic metallic regions does not change when a voltage is applied, and that the mechanism responsible for the low temperature metal insulator transition and the conduction behavior is the appearance of connective paths due to the enhanced mobility of carriers activated by the electric field. Fil: Villafuerte, Manuel Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina Fil: Bridoux, German. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina Fil: Heluani S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina Fil: Tirado, Monica Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; Argentina Fil: Grosse, Constantino. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina. Universidad Nacional de Tucuman. Facultad de Cs.exactas y Tecnología. Departamento de Física. Laboratorio de Dielectricos; Argentina |
| description |
Electric behavior of polycrystalline La 0.5 Ca 0.5 MnO 3 thin films, pulsed laser deposited on a (100) silicon substrate, is reported and discussed. An electrically induced metal-insulating transition around 150 K is found, which is voltage and thickness dependent. At low temperatures, the film conductivity is non-Ohmic and moderate electric fields lead to resistivity switching towards metaestable low-resistive states. Impedance spectroscopy measurements were also performed in order to determine the film dielectric permittivity and conductivity and to estimate the characteristic metal-semiconductor interface parameters. The obtained results show that the fraction of ferromagnetic metallic regions does not change when a voltage is applied, and that the mechanism responsible for the low temperature metal insulator transition and the conduction behavior is the appearance of connective paths due to the enhanced mobility of carriers activated by the electric field. |
| publishDate |
2010 |
| dc.date.none.fl_str_mv |
2010-02 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
| format |
article |
| status_str |
publishedVersion |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/279370 Villafuerte, Manuel Jose; Bridoux, German; Heluani S. P.; Tirado, Monica Cecilia; Grosse, Constantino; Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition; Elsevier Science SA; Thin Solid Films; 518; 8; 2-2010; 2261-2265 0040-6090 CONICET Digital CONICET |
| url |
http://hdl.handle.net/11336/279370 |
| identifier_str_mv |
Villafuerte, Manuel Jose; Bridoux, German; Heluani S. P.; Tirado, Monica Cecilia; Grosse, Constantino; Dielectric permittivity and conductivity spectra of La0.5Ca0.5MnO3 thin films presenting electric field induced metal–insulator transition; Elsevier Science SA; Thin Solid Films; 518; 8; 2-2010; 2261-2265 0040-6090 CONICET Digital CONICET |
| dc.language.none.fl_str_mv |
eng |
| language |
eng |
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info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S004060900901284X info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tsf.2009.07.149 |
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info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
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openAccess |
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https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
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application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf |
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Elsevier Science SA |
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Elsevier Science SA |
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reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
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dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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