Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy

Autores
Zaldivar Escola, Facundo; Mingolo, Nélida; Martínez, Oscar E.; Rocca, Jorge J.; Menoni, Carmen S.
Año de publicación
2019
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.
Fil: Zaldivar Escola, Facundo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Mingolo, Nélida. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Martínez, Oscar E.. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Rocca, Jorge J.. State University of Colorado - Fort Collins; Estados Unidos
Fil: Menoni, Carmen S.. State University of Colorado - Fort Collins; Estados Unidos
Materia
laser annealing mechanisms
photothermal microscopy
thin film coatings
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/118189
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/118189
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopyZaldivar Escola, FacundoMingolo, NélidaMartínez, Oscar E.Rocca, Jorge J.Menoni, Carmen S.laser annealing mechanismsphotothermal microscopythin film coatingshttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.Fil: Zaldivar Escola, Facundo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Mingolo, Nélida. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Martínez, Oscar E.. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Rocca, Jorge J.. State University of Colorado - Fort Collins; Estados UnidosFil: Menoni, Carmen S.. State University of Colorado - Fort Collins; Estados UnidosOptical Society of America2019-02info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/118189Zaldivar Escola, Facundo; Mingolo, Nélida; Martínez, Oscar E.; Rocca, Jorge J.; Menoni, Carmen S.; Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy; Optical Society of America; Optics Express; 27; 4; 2-2019; 5729-57441094-4087CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-4-5729&id=405099info:eu-repo/semantics/altIdentifier/doi/10.1364/OE.27.005729info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:14:51Zoai:ri.conicet.gov.ar:11336/118189instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:14:51.991CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
title Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
spellingShingle Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
Zaldivar Escola, Facundo
laser annealing mechanisms
photothermal microscopy
thin film coatings
title_short Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
title_full Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
title_fullStr Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
title_full_unstemmed Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
title_sort Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
dc.creator.none.fl_str_mv Zaldivar Escola, Facundo
Mingolo, Nélida
Martínez, Oscar E.
Rocca, Jorge J.
Menoni, Carmen S.
author Zaldivar Escola, Facundo
author_facet Zaldivar Escola, Facundo
Mingolo, Nélida
Martínez, Oscar E.
Rocca, Jorge J.
Menoni, Carmen S.
author_role author
author2 Mingolo, Nélida
Martínez, Oscar E.
Rocca, Jorge J.
Menoni, Carmen S.
author2_role author
author
author
author
dc.subject.none.fl_str_mv laser annealing mechanisms
photothermal microscopy
thin film coatings
topic laser annealing mechanisms
photothermal microscopy
thin film coatings
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.
Fil: Zaldivar Escola, Facundo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Mingolo, Nélida. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Martínez, Oscar E.. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Rocca, Jorge J.. State University of Colorado - Fort Collins; Estados Unidos
Fil: Menoni, Carmen S.. State University of Colorado - Fort Collins; Estados Unidos
description We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.
publishDate 2019
dc.date.none.fl_str_mv 2019-02
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/118189
Zaldivar Escola, Facundo; Mingolo, Nélida; Martínez, Oscar E.; Rocca, Jorge J.; Menoni, Carmen S.; Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy; Optical Society of America; Optics Express; 27; 4; 2-2019; 5729-5744
1094-4087
CONICET Digital
CONICET
url http://hdl.handle.net/11336/118189
identifier_str_mv Zaldivar Escola, Facundo; Mingolo, Nélida; Martínez, Oscar E.; Rocca, Jorge J.; Menoni, Carmen S.; Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy; Optical Society of America; Optics Express; 27; 4; 2-2019; 5729-5744
1094-4087
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-4-5729&id=405099
info:eu-repo/semantics/altIdentifier/doi/10.1364/OE.27.005729
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Optical Society of America
publisher.none.fl_str_mv Optical Society of America
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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