Cita APA

Ferreyra, C. D., Rengifo Morocho, M. A., Sanchez, M. J., Everhardt, A. S., Noheda, B., & Rubi, D. (2020). Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices. Web

Citación estilo Chicago

Ferreyra, Cristian Daniel, Miguel Andrés Rengifo Morocho, Maria Jose Sanchez, Arnoud S. Everhardt, Beatriz Noheda, and Diego Rubi. Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices. 2020.

Cita MLA

Ferreyra, Cristian Daniel, et al. Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices. 2020.