Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry

Autores
Tendela, Lucas Pedro; Federico, Roque Alejandro; Kaufmann, Guillermo Hector
Año de publicación
2011
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.
Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Universidad Nacional de Rosario; Argentina
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnologia Industrial; Argentina
Fil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y Sistemas; Argentina. Universidad Nacional de Rosario; Argentina
Materia
Digital Speckle Pattern Interferometry
Piezoelectric Transducers
Thick Films
Screen Printed Ceramics
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/15163
Acceder
id CONICETDig_ec16fd8341b13f585f45e609921c41d5
oai_identifier_str oai:ri.conicet.gov.ar:11336/15163
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometryTendela, Lucas PedroFederico, Roque AlejandroKaufmann, Guillermo HectorDigital Speckle Pattern InterferometryPiezoelectric TransducersThick FilmsScreen Printed Ceramicshttps://purl.org/becyt/ford/2.2https://purl.org/becyt/ford/2This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Universidad Nacional de Rosario; ArgentinaFil: Federico, Roque Alejandro. Instituto Nacional de Tecnologia Industrial; ArgentinaFil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y Sistemas; Argentina. Universidad Nacional de Rosario; ArgentinaElsevier2011-02info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/15163Tendela, Lucas Pedro; Federico, Roque Alejandro; Kaufmann, Guillermo Hector; Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry; Elsevier; Optics And Lasers In Engineering; 49; 2; 2-2011; 281-2840143-8166enginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.optlaseng.2010.10.002info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0143816610002125info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T14:47:40Zoai:ri.conicet.gov.ar:11336/15163instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 14:47:41.233CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
title Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
spellingShingle Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
Tendela, Lucas Pedro
Digital Speckle Pattern Interferometry
Piezoelectric Transducers
Thick Films
Screen Printed Ceramics
title_short Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
title_full Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
title_fullStr Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
title_full_unstemmed Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
title_sort Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
dc.creator.none.fl_str_mv Tendela, Lucas Pedro
Federico, Roque Alejandro
Kaufmann, Guillermo Hector
author Tendela, Lucas Pedro
author_facet Tendela, Lucas Pedro
Federico, Roque Alejandro
Kaufmann, Guillermo Hector
author_role author
author2 Federico, Roque Alejandro
Kaufmann, Guillermo Hector
author2_role author
author
dc.subject.none.fl_str_mv Digital Speckle Pattern Interferometry
Piezoelectric Transducers
Thick Films
Screen Printed Ceramics
topic Digital Speckle Pattern Interferometry
Piezoelectric Transducers
Thick Films
Screen Printed Ceramics
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.2
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.
Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Universidad Nacional de Rosario; Argentina
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnologia Industrial; Argentina
Fil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y Sistemas; Argentina. Universidad Nacional de Rosario; Argentina
description This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.
publishDate 2011
dc.date.none.fl_str_mv 2011-02
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/15163
Tendela, Lucas Pedro; Federico, Roque Alejandro; Kaufmann, Guillermo Hector; Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry; Elsevier; Optics And Lasers In Engineering; 49; 2; 2-2011; 281-284
0143-8166
url http://hdl.handle.net/11336/15163
identifier_str_mv Tendela, Lucas Pedro; Federico, Roque Alejandro; Kaufmann, Guillermo Hector; Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry; Elsevier; Optics And Lasers In Engineering; 49; 2; 2-2011; 281-284
0143-8166
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1016/j.optlaseng.2010.10.002
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0143816610002125
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1846082994135105536
score 13.22299

Publicaciones similares