High-temperature change of the creep rate in YBa 2Cu 3O 7-δ films with different pinning landscapes

• Autores: Haberkorn, Nestor Fabian; Miura, M.; Baca, J.; Maiorov, B.; Usov, I.; Dowden, P.; Foltyn, S. R.; Holesinger, T. G.; Willis, J. O.; Marken, K. R.; Izumi, T.; Shiohara, Y.; Civale, L.
• Año de publicación: 2012
• Idioma: inglés
• Tipo de recurso: artículo
• Materia: films; vortex dynamics; creep
• Institución: Consejo Nacional de Investigaciones Científicas y Técnicas

Magnetic relaxation measurements in YBa 2Cu 3O 7-δ (YBCO) films at intermediate and high temperatures show that the collective vortex creep based on the elastic motion of the vortex lattice has a crossover to fast creep that significantly reduces the superconducting critical current density (J c). This crossover occurs at temperatures much lower than the irreversibility field line. We study the influence of different kinds of crystalline defects, such as nanorods, twin boundaries, and nanoparticles, on the high-temperature vortex phase diagram of YBCO films. We found that the magnetization relaxation data is a fundamental tool to understand the pinning at high temperatures. The results indicate that high J c values are directly associated with small creep rates. Based on the analysis of the depinning temperature in films with columnar defects, our results indicate that the size of the defects is the relevant parameter that determines thermal depinning at high temperatures. Also, the extension of the collective creep regime depends on the density of the pinning centers.
Fil: Haberkorn, Nestor Fabian. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina
Fil: Miura, M.. No especifíca;
Fil: Baca, J.. No especifíca;
Fil: Maiorov, B.. No especifíca;
Fil: Usov, I.. No especifíca;
Fil: Dowden, P.. No especifíca;
Fil: Foltyn, S. R.. No especifíca;
Fil: Holesinger, T. G.. No especifíca;
Fil: Willis, J. O.. No especifíca;
Fil: Marken, K. R.. No especifíca;
Fil: Izumi, T.. No especifíca;
Fil: Shiohara, Y.. No especifíca;
Fil: Civale, L.. No especifíca;