Cita APA

Palumbo, F. R. M., Krylov, I., & Eizenberg, M. (2015). Comparison of the degradation characteristics of AlON/InGaAs and Al2O3/InGaAs stacks. Web

Citación estilo Chicago

Palumbo, Félix Roberto Mario, I. Krylov, and M. Eizenberg. Comparison of the Degradation Characteristics of AlON/InGaAs and Al2O3/InGaAs Stacks. 2015.

Cita MLA

Palumbo, Félix Roberto Mario, I. Krylov, and M. Eizenberg. Comparison of the Degradation Characteristics of AlON/InGaAs and Al2O3/InGaAs Stacks. 2015.