Cita APA

Macchi, C. E., Somoza, A. H., Guimpel, J. J., Suarez, S., Egger, W., Hugenschmidt, C., . . . Brusa, R. (2021). Oxygen related defects and vacancy clusters identified in sputtering grown UOx thin films by positron annihilation techniques. Web

Citación estilo Chicago

Macchi, Carlos Eugenio, Alberto Horacio Somoza, Julio Juan Guimpel, Sebastian Suarez, W. Egger, C. Hugenschmidt, S. Mariazzi, and R.S Brusa. Oxygen Related Defects and Vacancy Clusters Identified in Sputtering Grown UOx Thin Films By Positron Annihilation Techniques. 2021.

Cita MLA

Macchi, Carlos Eugenio, et al. Oxygen Related Defects and Vacancy Clusters Identified in Sputtering Grown UOx Thin Films By Positron Annihilation Techniques. 2021.