Tosi, L., Osquiguil, E. J., Kaul, E. E., & Balseiro, C. A. (2012). Barkhausen-type noise in the resistance of antiferromagnetic Cr thin films. Web
Citación estilo ChicagoTosi, Leandro, Eduardo Jose Osquiguil, Enrique Eduardo Kaul, and Carlos Antonio Balseiro. Barkhausen-type Noise in the Resistance of Antiferromagnetic Cr Thin Films. 2012.
Cita MLATosi, Leandro, Eduardo Jose Osquiguil, Enrique Eduardo Kaul, and Carlos Antonio Balseiro. Barkhausen-type Noise in the Resistance of Antiferromagnetic Cr Thin Films. 2012.
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