On the origin of the low temperatures resistivity minimum in Cr thin films

Autores
Osquiguil, Eduardo Jose; Tosi, Leandro; Kaul, Enrique Eduardo; Balseiro, Carlos Antonio
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
We present measurements of the electrical resistivity and Hall coefficient, ρ and RH, in Cr films of different thicknesses grown on MgO (100) substrates, as a function of temperature T and applied magnetic field H. The results show a low temperature minimum in ρ(T), which is thickness dependent. From 40 K to 2 K, the Hall coefficient is a monotonous increasing function as T is reduced with no particular signature at the temperature T min where the minimum develops. We explain the resistivity minimum assuming an imperfect nesting of the Fermi surface leading to small electron and hole pockets. We introduce a phenomenological model which supports this simple physical picture.
Fil: Osquiguil, Eduardo Jose. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Tosi, Leandro. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Kaul, Enrique Eduardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina
Fil: Balseiro, Carlos Antonio. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Materia
CHROMIUM
RESISTIVITY
HYSTERESIS
LOW-TEMPERATURES
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/180768
Acceder
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network_name_str CONICET Digital (CONICET)
spelling On the origin of the low temperatures resistivity minimum in Cr thin filmsOsquiguil, Eduardo JoseTosi, LeandroKaul, Enrique EduardoBalseiro, Carlos AntonioCHROMIUMRESISTIVITYHYSTERESISLOW-TEMPERATUREShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1We present measurements of the electrical resistivity and Hall coefficient, ρ and RH, in Cr films of different thicknesses grown on MgO (100) substrates, as a function of temperature T and applied magnetic field H. The results show a low temperature minimum in ρ(T), which is thickness dependent. From 40 K to 2 K, the Hall coefficient is a monotonous increasing function as T is reduced with no particular signature at the temperature T min where the minimum develops. We explain the resistivity minimum assuming an imperfect nesting of the Fermi surface leading to small electron and hole pockets. We introduce a phenomenological model which supports this simple physical picture.Fil: Osquiguil, Eduardo Jose. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Tosi, Leandro. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Kaul, Enrique Eduardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); ArgentinaFil: Balseiro, Carlos Antonio. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaAmerican Institute of Physics2013-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/180768Osquiguil, Eduardo Jose; Tosi, Leandro; Kaul, Enrique Eduardo; Balseiro, Carlos Antonio; On the origin of the low temperatures resistivity minimum in Cr thin films; American Institute of Physics; Journal of Applied Physics; 144; 24; 12-2013; 243902-2439080021-8979CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://scitation.aip.org/content/aip/journal/jap/114/24/10.1063/1.4846757info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4846757info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:06:15Zoai:ri.conicet.gov.ar:11336/180768instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:06:16.201CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv On the origin of the low temperatures resistivity minimum in Cr thin films
title On the origin of the low temperatures resistivity minimum in Cr thin films
spellingShingle On the origin of the low temperatures resistivity minimum in Cr thin films
Osquiguil, Eduardo Jose
CHROMIUM
RESISTIVITY
HYSTERESIS
LOW-TEMPERATURES
title_short On the origin of the low temperatures resistivity minimum in Cr thin films
title_full On the origin of the low temperatures resistivity minimum in Cr thin films
title_fullStr On the origin of the low temperatures resistivity minimum in Cr thin films
title_full_unstemmed On the origin of the low temperatures resistivity minimum in Cr thin films
title_sort On the origin of the low temperatures resistivity minimum in Cr thin films
dc.creator.none.fl_str_mv Osquiguil, Eduardo Jose
Tosi, Leandro
Kaul, Enrique Eduardo
Balseiro, Carlos Antonio
author Osquiguil, Eduardo Jose
author_facet Osquiguil, Eduardo Jose
Tosi, Leandro
Kaul, Enrique Eduardo
Balseiro, Carlos Antonio
author_role author
author2 Tosi, Leandro
Kaul, Enrique Eduardo
Balseiro, Carlos Antonio
author2_role author
author
author
dc.subject.none.fl_str_mv CHROMIUM
RESISTIVITY
HYSTERESIS
LOW-TEMPERATURES
topic CHROMIUM
RESISTIVITY
HYSTERESIS
LOW-TEMPERATURES
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv We present measurements of the electrical resistivity and Hall coefficient, ρ and RH, in Cr films of different thicknesses grown on MgO (100) substrates, as a function of temperature T and applied magnetic field H. The results show a low temperature minimum in ρ(T), which is thickness dependent. From 40 K to 2 K, the Hall coefficient is a monotonous increasing function as T is reduced with no particular signature at the temperature T min where the minimum develops. We explain the resistivity minimum assuming an imperfect nesting of the Fermi surface leading to small electron and hole pockets. We introduce a phenomenological model which supports this simple physical picture.
Fil: Osquiguil, Eduardo Jose. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Tosi, Leandro. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Kaul, Enrique Eduardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina
Fil: Balseiro, Carlos Antonio. Comisión Nacional de Energía Atómica. Gerencia del Área de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
description We present measurements of the electrical resistivity and Hall coefficient, ρ and RH, in Cr films of different thicknesses grown on MgO (100) substrates, as a function of temperature T and applied magnetic field H. The results show a low temperature minimum in ρ(T), which is thickness dependent. From 40 K to 2 K, the Hall coefficient is a monotonous increasing function as T is reduced with no particular signature at the temperature T min where the minimum develops. We explain the resistivity minimum assuming an imperfect nesting of the Fermi surface leading to small electron and hole pockets. We introduce a phenomenological model which supports this simple physical picture.
publishDate 2013
dc.date.none.fl_str_mv 2013-12
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/180768
Osquiguil, Eduardo Jose; Tosi, Leandro; Kaul, Enrique Eduardo; Balseiro, Carlos Antonio; On the origin of the low temperatures resistivity minimum in Cr thin films; American Institute of Physics; Journal of Applied Physics; 144; 24; 12-2013; 243902-243908
0021-8979
CONICET Digital
CONICET
url http://hdl.handle.net/11336/180768
identifier_str_mv Osquiguil, Eduardo Jose; Tosi, Leandro; Kaul, Enrique Eduardo; Balseiro, Carlos Antonio; On the origin of the low temperatures resistivity minimum in Cr thin films; American Institute of Physics; Journal of Applied Physics; 144; 24; 12-2013; 243902-243908
0021-8979
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://scitation.aip.org/content/aip/journal/jap/114/24/10.1063/1.4846757
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4846757
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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