Cita APA

Dietrich, S., Carrera, J., Weinzettel, P., & Sierra, L. (2018). Estimation of specific yield and its variability by electrical resistivity tomography. Web

Citación estilo Chicago

Dietrich, Sebastián, Jesús Carrera, Pablo Weinzettel, and Leonardo Sierra. Estimation of Specific Yield and Its Variability By Electrical Resistivity Tomography. 2018.

Cita MLA

Dietrich, Sebastián, Jesús Carrera, Pablo Weinzettel, and Leonardo Sierra. Estimation of Specific Yield and Its Variability By Electrical Resistivity Tomography. 2018.