A facility for the study of Single Event Effects in the TANDAR accelerator

Autores
Ibarra, M. L.; Portu, Agustina Mariana; Saint Martin, María Laura Gisela; Barrera, Marcela Patricia; Filevich, Alberto; Alurralde, M.
Año de publicación
2018
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Semiconductor devices used in space applications suffer degradation due to the space radiation environment, which affects their electric parameters, eventually reducing the in-orbit lifetime. This relatively slow behavior is due to cumulative total dose effects. On the other hand, radiation can destroy information or even damage electronic parts of the device in a sudden way. These processes are known as Single Event Effects (SEE). Heavy ion beams from electrostatic tandem or other accelerators can be used to test and characterize the response of the electronics to SEE. Two conditions are necessary for this purpose: to use very low fluxes of only a few hundred to hundreds of thousand particles/(cm2·s), and to browse over a wide Linear Energy Transfer (LET) interval by changing the energy and/or the type of the impinging particles. In this work we describe the facility developed at the Argentine tandem accelerator (Tandar) to study SEE, and especially the fabrication and use of a perforated Ta foil to reduce the beam current to the required values. The determination of the resulting beam uniformity over the area of irradiation is also reported. The system has been tested by a SEE experiment on a webcam sensor.
Fil: Ibarra, M. L.. Comisión Nacional de Energía Atómica; Argentina
Fil: Portu, Agustina Mariana. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina
Fil: Saint Martin, María Laura Gisela. Comisión Nacional de Energía Atómica; Argentina. Universidad Nacional de San Martín. Instituto Sabato; Argentina
Fil: Barrera, Marcela Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina
Fil: Filevich, Alberto. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Alurralde, M.. Universidad Nacional de San Martín. Instituto Sabato; Argentina. Comisión Nacional de Energía Atómica; Argentina
Materia
ELECTROSTATIC ACCELERATOR
NUCLEAR TRACK DETECTOR
RADIATION DAMAGE
SINGLE EVENT EFFECTS
TANTALUM FILTER
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/162609
Acceder
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repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling A facility for the study of Single Event Effects in the TANDAR acceleratorIbarra, M. L.Portu, Agustina MarianaSaint Martin, María Laura GiselaBarrera, Marcela PatriciaFilevich, AlbertoAlurralde, M.ELECTROSTATIC ACCELERATORNUCLEAR TRACK DETECTORRADIATION DAMAGESINGLE EVENT EFFECTSTANTALUM FILTERhttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2Semiconductor devices used in space applications suffer degradation due to the space radiation environment, which affects their electric parameters, eventually reducing the in-orbit lifetime. This relatively slow behavior is due to cumulative total dose effects. On the other hand, radiation can destroy information or even damage electronic parts of the device in a sudden way. These processes are known as Single Event Effects (SEE). Heavy ion beams from electrostatic tandem or other accelerators can be used to test and characterize the response of the electronics to SEE. Two conditions are necessary for this purpose: to use very low fluxes of only a few hundred to hundreds of thousand particles/(cm2·s), and to browse over a wide Linear Energy Transfer (LET) interval by changing the energy and/or the type of the impinging particles. In this work we describe the facility developed at the Argentine tandem accelerator (Tandar) to study SEE, and especially the fabrication and use of a perforated Ta foil to reduce the beam current to the required values. The determination of the resulting beam uniformity over the area of irradiation is also reported. The system has been tested by a SEE experiment on a webcam sensor.Fil: Ibarra, M. L.. Comisión Nacional de Energía Atómica; ArgentinaFil: Portu, Agustina Mariana. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; ArgentinaFil: Saint Martin, María Laura Gisela. Comisión Nacional de Energía Atómica; Argentina. Universidad Nacional de San Martín. Instituto Sabato; ArgentinaFil: Barrera, Marcela Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; ArgentinaFil: Filevich, Alberto. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Alurralde, M.. Universidad Nacional de San Martín. Instituto Sabato; Argentina. Comisión Nacional de Energía Atómica; ArgentinaElsevier2018-10info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/162609Ibarra, M. L.; Portu, Agustina Mariana; Saint Martin, María Laura Gisela; Barrera, Marcela Patricia; Filevich, Alberto; et al.; A facility for the study of Single Event Effects in the TANDAR accelerator; Elsevier; Beam Interactions with Materials and Atoms; 433; 10-2018; 69-750168-583XCONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.journals.elsevier.com/nuclear-instruments-and-methods-in-physics-research-section-b-beam-interactions-with-materials-and-atomsinfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.nimb.2018.07.021info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:36:59Zoai:ri.conicet.gov.ar:11336/162609instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:36:59.757CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv A facility for the study of Single Event Effects in the TANDAR accelerator
title A facility for the study of Single Event Effects in the TANDAR accelerator
spellingShingle A facility for the study of Single Event Effects in the TANDAR accelerator
Ibarra, M. L.
ELECTROSTATIC ACCELERATOR
NUCLEAR TRACK DETECTOR
RADIATION DAMAGE
SINGLE EVENT EFFECTS
TANTALUM FILTER
title_short A facility for the study of Single Event Effects in the TANDAR accelerator
title_full A facility for the study of Single Event Effects in the TANDAR accelerator
title_fullStr A facility for the study of Single Event Effects in the TANDAR accelerator
title_full_unstemmed A facility for the study of Single Event Effects in the TANDAR accelerator
title_sort A facility for the study of Single Event Effects in the TANDAR accelerator
dc.creator.none.fl_str_mv Ibarra, M. L.
Portu, Agustina Mariana
Saint Martin, María Laura Gisela
Barrera, Marcela Patricia
Filevich, Alberto
Alurralde, M.
author Ibarra, M. L.
author_facet Ibarra, M. L.
Portu, Agustina Mariana
Saint Martin, María Laura Gisela
Barrera, Marcela Patricia
Filevich, Alberto
Alurralde, M.
author_role author
author2 Portu, Agustina Mariana
Saint Martin, María Laura Gisela
Barrera, Marcela Patricia
Filevich, Alberto
Alurralde, M.
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv ELECTROSTATIC ACCELERATOR
NUCLEAR TRACK DETECTOR
RADIATION DAMAGE
SINGLE EVENT EFFECTS
TANTALUM FILTER
topic ELECTROSTATIC ACCELERATOR
NUCLEAR TRACK DETECTOR
RADIATION DAMAGE
SINGLE EVENT EFFECTS
TANTALUM FILTER
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv Semiconductor devices used in space applications suffer degradation due to the space radiation environment, which affects their electric parameters, eventually reducing the in-orbit lifetime. This relatively slow behavior is due to cumulative total dose effects. On the other hand, radiation can destroy information or even damage electronic parts of the device in a sudden way. These processes are known as Single Event Effects (SEE). Heavy ion beams from electrostatic tandem or other accelerators can be used to test and characterize the response of the electronics to SEE. Two conditions are necessary for this purpose: to use very low fluxes of only a few hundred to hundreds of thousand particles/(cm2·s), and to browse over a wide Linear Energy Transfer (LET) interval by changing the energy and/or the type of the impinging particles. In this work we describe the facility developed at the Argentine tandem accelerator (Tandar) to study SEE, and especially the fabrication and use of a perforated Ta foil to reduce the beam current to the required values. The determination of the resulting beam uniformity over the area of irradiation is also reported. The system has been tested by a SEE experiment on a webcam sensor.
Fil: Ibarra, M. L.. Comisión Nacional de Energía Atómica; Argentina
Fil: Portu, Agustina Mariana. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina
Fil: Saint Martin, María Laura Gisela. Comisión Nacional de Energía Atómica; Argentina. Universidad Nacional de San Martín. Instituto Sabato; Argentina
Fil: Barrera, Marcela Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina
Fil: Filevich, Alberto. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Alurralde, M.. Universidad Nacional de San Martín. Instituto Sabato; Argentina. Comisión Nacional de Energía Atómica; Argentina
description Semiconductor devices used in space applications suffer degradation due to the space radiation environment, which affects their electric parameters, eventually reducing the in-orbit lifetime. This relatively slow behavior is due to cumulative total dose effects. On the other hand, radiation can destroy information or even damage electronic parts of the device in a sudden way. These processes are known as Single Event Effects (SEE). Heavy ion beams from electrostatic tandem or other accelerators can be used to test and characterize the response of the electronics to SEE. Two conditions are necessary for this purpose: to use very low fluxes of only a few hundred to hundreds of thousand particles/(cm2·s), and to browse over a wide Linear Energy Transfer (LET) interval by changing the energy and/or the type of the impinging particles. In this work we describe the facility developed at the Argentine tandem accelerator (Tandar) to study SEE, and especially the fabrication and use of a perforated Ta foil to reduce the beam current to the required values. The determination of the resulting beam uniformity over the area of irradiation is also reported. The system has been tested by a SEE experiment on a webcam sensor.
publishDate 2018
dc.date.none.fl_str_mv 2018-10
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/162609
Ibarra, M. L.; Portu, Agustina Mariana; Saint Martin, María Laura Gisela; Barrera, Marcela Patricia; Filevich, Alberto; et al.; A facility for the study of Single Event Effects in the TANDAR accelerator; Elsevier; Beam Interactions with Materials and Atoms; 433; 10-2018; 69-75
0168-583X
CONICET Digital
CONICET
url http://hdl.handle.net/11336/162609
identifier_str_mv Ibarra, M. L.; Portu, Agustina Mariana; Saint Martin, María Laura Gisela; Barrera, Marcela Patricia; Filevich, Alberto; et al.; A facility for the study of Single Event Effects in the TANDAR accelerator; Elsevier; Beam Interactions with Materials and Atoms; 433; 10-2018; 69-75
0168-583X
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.journals.elsevier.com/nuclear-instruments-and-methods-in-physics-research-section-b-beam-interactions-with-materials-and-atoms
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.nimb.2018.07.021
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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