OCT in applications that involve the measurement of large dimensions

Autores
Russo, Nelida Araceli; Morel, Eneas Nicolas; Torga, Jorge Román; Duchowicz, Ricardo
Año de publicación
2020
Idioma
inglés
Tipo de recurso
parte de libro
Estado
versión publicada
Descripción
The application of Optical Coherence Tomography technique is not very common when measuring large dimensions is required. This type of measurements can be critical to achieve satisfactory results in the manufacturing process of precision parts. Components and structures ranging from sub-millimeter to several centimeters size can be found in many fields including automotive, aerospace, semiconductor and data storage industries to name a few. In this chapter, an interferometric system based on the SS-OCT technique, which has a wide measurement range and good axial resolution, is presented and its constituent parts are analyzed. The scheme includes a self-calibration stage based on fiber Bragg gratings, that allows monitoring the spectral position of the light source in each scan, having the advantage of being a passive system that requires no additional electronic devices. Several applications of the system are described, including measurement of distances up to 17 cm, characterization of multilayer transparent and semitransparent structures, simultaneous determination of thickness of the wall, internal and external diameter of glass ampoules or similar containers, thickness measurements in opaque samples or where the refractive index is unknown, etc.
Fil: Russo, Nelida Araceli. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
Fil: Morel, Eneas Nicolas. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Duchowicz, Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
Materia
Interferometry
Optical coherence tomography
non-destructive test
optical metrology
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/246467
Acceder
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network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling OCT in applications that involve the measurement of large dimensionsRusso, Nelida AraceliMorel, Eneas NicolasTorga, Jorge RománDuchowicz, RicardoInterferometryOptical coherence tomographynon-destructive testoptical metrologyhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The application of Optical Coherence Tomography technique is not very common when measuring large dimensions is required. This type of measurements can be critical to achieve satisfactory results in the manufacturing process of precision parts. Components and structures ranging from sub-millimeter to several centimeters size can be found in many fields including automotive, aerospace, semiconductor and data storage industries to name a few. In this chapter, an interferometric system based on the SS-OCT technique, which has a wide measurement range and good axial resolution, is presented and its constituent parts are analyzed. The scheme includes a self-calibration stage based on fiber Bragg gratings, that allows monitoring the spectral position of the light source in each scan, having the advantage of being a passive system that requires no additional electronic devices. Several applications of the system are described, including measurement of distances up to 17 cm, characterization of multilayer transparent and semitransparent structures, simultaneous determination of thickness of the wall, internal and external diameter of glass ampoules or similar containers, thickness measurements in opaque samples or where the refractive index is unknown, etc.Fil: Russo, Nelida Araceli. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; ArgentinaFil: Morel, Eneas Nicolas. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Duchowicz, Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; ArgentinaIntechOpenWang, Michael2020info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookParthttp://purl.org/coar/resource_type/c_3248info:ar-repo/semantics/parteDeLibroapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/246467Russo, Nelida Araceli; Morel, Eneas Nicolas; Torga, Jorge Román; Duchowicz, Ricardo; OCT in applications that involve the measurement of large dimensions; IntechOpen; 2020; 82-113978-1-78984-262-3CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.intechopen.com/chapters/68213info:eu-repo/semantics/altIdentifier/doi/10.5772/intechopen.88186info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T15:44:57Zoai:ri.conicet.gov.ar:11336/246467instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 15:44:58.016CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv OCT in applications that involve the measurement of large dimensions
title OCT in applications that involve the measurement of large dimensions
spellingShingle OCT in applications that involve the measurement of large dimensions
Russo, Nelida Araceli
Interferometry
Optical coherence tomography
non-destructive test
optical metrology
title_short OCT in applications that involve the measurement of large dimensions
title_full OCT in applications that involve the measurement of large dimensions
title_fullStr OCT in applications that involve the measurement of large dimensions
title_full_unstemmed OCT in applications that involve the measurement of large dimensions
title_sort OCT in applications that involve the measurement of large dimensions
dc.creator.none.fl_str_mv Russo, Nelida Araceli
Morel, Eneas Nicolas
Torga, Jorge Román
Duchowicz, Ricardo
author Russo, Nelida Araceli
author_facet Russo, Nelida Araceli
Morel, Eneas Nicolas
Torga, Jorge Román
Duchowicz, Ricardo
author_role author
author2 Morel, Eneas Nicolas
Torga, Jorge Román
Duchowicz, Ricardo
author2_role author
author
author
dc.contributor.none.fl_str_mv Wang, Michael
dc.subject.none.fl_str_mv Interferometry
Optical coherence tomography
non-destructive test
optical metrology
topic Interferometry
Optical coherence tomography
non-destructive test
optical metrology
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The application of Optical Coherence Tomography technique is not very common when measuring large dimensions is required. This type of measurements can be critical to achieve satisfactory results in the manufacturing process of precision parts. Components and structures ranging from sub-millimeter to several centimeters size can be found in many fields including automotive, aerospace, semiconductor and data storage industries to name a few. In this chapter, an interferometric system based on the SS-OCT technique, which has a wide measurement range and good axial resolution, is presented and its constituent parts are analyzed. The scheme includes a self-calibration stage based on fiber Bragg gratings, that allows monitoring the spectral position of the light source in each scan, having the advantage of being a passive system that requires no additional electronic devices. Several applications of the system are described, including measurement of distances up to 17 cm, characterization of multilayer transparent and semitransparent structures, simultaneous determination of thickness of the wall, internal and external diameter of glass ampoules or similar containers, thickness measurements in opaque samples or where the refractive index is unknown, etc.
Fil: Russo, Nelida Araceli. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
Fil: Morel, Eneas Nicolas. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Duchowicz, Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
description The application of Optical Coherence Tomography technique is not very common when measuring large dimensions is required. This type of measurements can be critical to achieve satisfactory results in the manufacturing process of precision parts. Components and structures ranging from sub-millimeter to several centimeters size can be found in many fields including automotive, aerospace, semiconductor and data storage industries to name a few. In this chapter, an interferometric system based on the SS-OCT technique, which has a wide measurement range and good axial resolution, is presented and its constituent parts are analyzed. The scheme includes a self-calibration stage based on fiber Bragg gratings, that allows monitoring the spectral position of the light source in each scan, having the advantage of being a passive system that requires no additional electronic devices. Several applications of the system are described, including measurement of distances up to 17 cm, characterization of multilayer transparent and semitransparent structures, simultaneous determination of thickness of the wall, internal and external diameter of glass ampoules or similar containers, thickness measurements in opaque samples or where the refractive index is unknown, etc.
publishDate 2020
dc.date.none.fl_str_mv 2020
dc.type.none.fl_str_mv info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/bookPart
http://purl.org/coar/resource_type/c_3248
info:ar-repo/semantics/parteDeLibro
status_str publishedVersion
format bookPart
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/246467
Russo, Nelida Araceli; Morel, Eneas Nicolas; Torga, Jorge Román; Duchowicz, Ricardo; OCT in applications that involve the measurement of large dimensions; IntechOpen; 2020; 82-113
978-1-78984-262-3
CONICET Digital
CONICET
url http://hdl.handle.net/11336/246467
identifier_str_mv Russo, Nelida Araceli; Morel, Eneas Nicolas; Torga, Jorge Román; Duchowicz, Ricardo; OCT in applications that involve the measurement of large dimensions; IntechOpen; 2020; 82-113
978-1-78984-262-3
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.intechopen.com/chapters/68213
info:eu-repo/semantics/altIdentifier/doi/10.5772/intechopen.88186
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv IntechOpen
publisher.none.fl_str_mv IntechOpen
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.22299

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