Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)

Autores
Domené, Esteban Alejo; Martínez, Oscar E.
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).
Fil: Domené, Esteban Alejo. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Electrónica Cuántica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Martínez, Oscar E.. Empresa Tolket Srl; Argentina
Materia
Fototérmica
Difusividad Térmica
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/19097
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/19097
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)Domené, Esteban AlejoMartínez, Oscar E.FototérmicaDifusividad Térmicahttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).Fil: Domené, Esteban Alejo. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Electrónica Cuántica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Martínez, Oscar E.. Empresa Tolket Srl; ArgentinaAmerican Institute of Physics2013-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/19097Domené, Esteban Alejo; Martínez, Oscar E.; Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM); American Institute of Physics; Review of Scientific Instruments; 84; 1; 1-2013; 1-3; 0161040034-6748CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4774111info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4774111info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T12:04:03Zoai:ri.conicet.gov.ar:11336/19097instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 12:04:03.309CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
spellingShingle Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
Domené, Esteban Alejo
Fototérmica
Difusividad Térmica
title_short Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_full Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_fullStr Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_full_unstemmed Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_sort Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
dc.creator.none.fl_str_mv Domené, Esteban Alejo
Martínez, Oscar E.
author Domené, Esteban Alejo
author_facet Domené, Esteban Alejo
Martínez, Oscar E.
author_role author
author2 Martínez, Oscar E.
author2_role author
dc.subject.none.fl_str_mv Fototérmica
Difusividad Térmica
topic Fototérmica
Difusividad Térmica
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).
Fil: Domené, Esteban Alejo. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Electrónica Cuántica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Martínez, Oscar E.. Empresa Tolket Srl; Argentina
description An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).
publishDate 2013
dc.date.none.fl_str_mv 2013-01
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/19097
Domené, Esteban Alejo; Martínez, Oscar E.; Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM); American Institute of Physics; Review of Scientific Instruments; 84; 1; 1-2013; 1-3; 016104
0034-6748
CONICET Digital
CONICET
url http://hdl.handle.net/11336/19097
identifier_str_mv Domené, Esteban Alejo; Martínez, Oscar E.; Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM); American Institute of Physics; Review of Scientific Instruments; 84; 1; 1-2013; 1-3; 016104
0034-6748
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4774111
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4774111
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1846782386454396928
score 12.982451

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