Thickness effects on the pinning by columnar defects
- Autores
- Silhanek, Alejandro Vladimiro; Guimpel, Julio Juan; Civale, Leonardo; Lanza, H.; Levy, Pablo Eduardo
- Año de publicación
- 2000
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- We compare the angular dependence of the pinning of equivalent columnar defects in GdBa2Cu3O7 thin films and a thicker YBa2Cu3O7 single crystal. The tracks' related enhancement of the critical currents is much smaller for the case of the thin films. We interpret this thickness dependence as resulting from a competition between the pinning of the correlated structures, related to total sample thickness, and surface boundary conditions, which force the vortices to depin from the columnar defects near the sample surface. © 2000 Elsevier Science B.V. All rights reserved.
Fil: Silhanek, Alejandro Vladimiro. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina
Fil: Guimpel, Julio Juan. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina
Fil: Civale, Leonardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina
Fil: Lanza, H.. Comisión Nacional de Energía Atómica; Argentina
Fil: Levy, Pablo Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina - Materia
-
Superconductivity
Columnar Defects
Flux Pinning
Critical Current Density - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/71650
Ver los metadatos del registro completo
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Thickness effects on the pinning by columnar defectsSilhanek, Alejandro VladimiroGuimpel, Julio JuanCivale, LeonardoLanza, H.Levy, Pablo EduardoSuperconductivityColumnar DefectsFlux PinningCritical Current Densityhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1We compare the angular dependence of the pinning of equivalent columnar defects in GdBa2Cu3O7 thin films and a thicker YBa2Cu3O7 single crystal. The tracks' related enhancement of the critical currents is much smaller for the case of the thin films. We interpret this thickness dependence as resulting from a competition between the pinning of the correlated structures, related to total sample thickness, and surface boundary conditions, which force the vortices to depin from the columnar defects near the sample surface. © 2000 Elsevier Science B.V. All rights reserved.Fil: Silhanek, Alejandro Vladimiro. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; ArgentinaFil: Guimpel, Julio Juan. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; ArgentinaFil: Civale, Leonardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; ArgentinaFil: Lanza, H.. Comisión Nacional de Energía Atómica; ArgentinaFil: Levy, Pablo Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; ArgentinaElsevier Science2000-11info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/71650Silhanek, Alejandro Vladimiro; Guimpel, Julio Juan; Civale, Leonardo; Lanza, H.; Levy, Pablo Eduardo; Thickness effects on the pinning by columnar defects; Elsevier Science; Physica C - Supercondutivity; 341-348; 11-2000; 1217-12180921-4534CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/S0921-4534(00)01118-7info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0921453400011187info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:21:54Zoai:ri.conicet.gov.ar:11336/71650instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:21:54.649CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Thickness effects on the pinning by columnar defects |
title |
Thickness effects on the pinning by columnar defects |
spellingShingle |
Thickness effects on the pinning by columnar defects Silhanek, Alejandro Vladimiro Superconductivity Columnar Defects Flux Pinning Critical Current Density |
title_short |
Thickness effects on the pinning by columnar defects |
title_full |
Thickness effects on the pinning by columnar defects |
title_fullStr |
Thickness effects on the pinning by columnar defects |
title_full_unstemmed |
Thickness effects on the pinning by columnar defects |
title_sort |
Thickness effects on the pinning by columnar defects |
dc.creator.none.fl_str_mv |
Silhanek, Alejandro Vladimiro Guimpel, Julio Juan Civale, Leonardo Lanza, H. Levy, Pablo Eduardo |
author |
Silhanek, Alejandro Vladimiro |
author_facet |
Silhanek, Alejandro Vladimiro Guimpel, Julio Juan Civale, Leonardo Lanza, H. Levy, Pablo Eduardo |
author_role |
author |
author2 |
Guimpel, Julio Juan Civale, Leonardo Lanza, H. Levy, Pablo Eduardo |
author2_role |
author author author author |
dc.subject.none.fl_str_mv |
Superconductivity Columnar Defects Flux Pinning Critical Current Density |
topic |
Superconductivity Columnar Defects Flux Pinning Critical Current Density |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
We compare the angular dependence of the pinning of equivalent columnar defects in GdBa2Cu3O7 thin films and a thicker YBa2Cu3O7 single crystal. The tracks' related enhancement of the critical currents is much smaller for the case of the thin films. We interpret this thickness dependence as resulting from a competition between the pinning of the correlated structures, related to total sample thickness, and surface boundary conditions, which force the vortices to depin from the columnar defects near the sample surface. © 2000 Elsevier Science B.V. All rights reserved. Fil: Silhanek, Alejandro Vladimiro. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina Fil: Guimpel, Julio Juan. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina Fil: Civale, Leonardo. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina Fil: Lanza, H.. Comisión Nacional de Energía Atómica; Argentina Fil: Levy, Pablo Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica; Argentina |
description |
We compare the angular dependence of the pinning of equivalent columnar defects in GdBa2Cu3O7 thin films and a thicker YBa2Cu3O7 single crystal. The tracks' related enhancement of the critical currents is much smaller for the case of the thin films. We interpret this thickness dependence as resulting from a competition between the pinning of the correlated structures, related to total sample thickness, and surface boundary conditions, which force the vortices to depin from the columnar defects near the sample surface. © 2000 Elsevier Science B.V. All rights reserved. |
publishDate |
2000 |
dc.date.none.fl_str_mv |
2000-11 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/71650 Silhanek, Alejandro Vladimiro; Guimpel, Julio Juan; Civale, Leonardo; Lanza, H.; Levy, Pablo Eduardo; Thickness effects on the pinning by columnar defects; Elsevier Science; Physica C - Supercondutivity; 341-348; 11-2000; 1217-1218 0921-4534 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/71650 |
identifier_str_mv |
Silhanek, Alejandro Vladimiro; Guimpel, Julio Juan; Civale, Leonardo; Lanza, H.; Levy, Pablo Eduardo; Thickness effects on the pinning by columnar defects; Elsevier Science; Physica C - Supercondutivity; 341-348; 11-2000; 1217-1218 0921-4534 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1016/S0921-4534(00)01118-7 info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0921453400011187 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier Science |
publisher.none.fl_str_mv |
Elsevier Science |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) |
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CONICET Digital (CONICET) |
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Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1844614209529184256 |
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13.070432 |