Statistically meaningful measure of domain-wall roughness in magnetic thin films
- Autores
- Jordán Ringgold, Daniel; Albornoz, Lucas Javier; Gorchon, Jon; Lambert, Charles Henri; Salahuddin, Sayeef; Bokor, Jeffrey; Curiale, Carlos Javier; Bustingorry, Sebastian
- Año de publicación
- 2020
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Domain walls in magnetic thin films display a complex dynamical response when subject to an external drive. It is claimed that different dynamic regimes are correlated with the domain-wall roughness, i.e., with the fluctuations of domain-wall position due to the inherent disorder in the system. Therefore, key to understanding the dynamics of domain walls is to have a statistically meaningful measure of the domain-wall roughness. Here we present a thorough study of the roughness parameters, i.e., roughness exponent and roughness amplitude, for domain walls in a ferrimagnetic GdFeCo thin film in the creep regime. Histograms of roughness parameters are constructed with more than 40 independent realizations under the same experimental conditions, and the average values and standard deviations are compared in different conditions. We found that the most prominent feature of the obtained distributions is their large standard deviations, which is a signature of large fluctuations. We show that even if the roughness parameters for a particular domain wall are well known, these parameters are not necessarily representative of the underlying physics of the system. In the low field limit, within the creep regime of domain-wall motion, we found the average roughness exponent and roughness amplitude to be around 0.75 and 0.45 μm2, respectively. When an in-plane magnetic field is applied we observed that, even though the distributions are wide, changes in the mean values of roughness parameters can be identified; the roughness exponent decreasing to values around 0.72 while the roughness amplitude increases to 0.65 μm2. Our results call for a careful consideration of statistical averaging over different domains walls when reporting roughness exponents.
Fil: Jordán Ringgold, Daniel. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro | Universidad Nacional de Cuyo. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro; Argentina
Fil: Albornoz, Lucas Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina
Fil: Gorchon, Jon. Lawrence Berkeley National Laboratory; Estados Unidos
Fil: Lambert, Charles Henri. University of California at Berkeley; Estados Unidos
Fil: Salahuddin, Sayeef. University of California at Berkeley; Estados Unidos
Fil: Bokor, Jeffrey. University of California at Berkeley; Estados Unidos. Lawrence Berkeley National Laboratory; Estados Unidos
Fil: Curiale, Carlos Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina
Fil: Bustingorry, Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina - Materia
-
DOMAIN WALL
ROUGHNESS
MAGNETISM
THIN FILMS - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/146663
Ver los metadatos del registro completo
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Statistically meaningful measure of domain-wall roughness in magnetic thin filmsJordán Ringgold, DanielAlbornoz, Lucas JavierGorchon, JonLambert, Charles HenriSalahuddin, SayeefBokor, JeffreyCuriale, Carlos JavierBustingorry, SebastianDOMAIN WALLROUGHNESSMAGNETISMTHIN FILMShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1https://purl.org/becyt/ford/2.10https://purl.org/becyt/ford/2Domain walls in magnetic thin films display a complex dynamical response when subject to an external drive. It is claimed that different dynamic regimes are correlated with the domain-wall roughness, i.e., with the fluctuations of domain-wall position due to the inherent disorder in the system. Therefore, key to understanding the dynamics of domain walls is to have a statistically meaningful measure of the domain-wall roughness. Here we present a thorough study of the roughness parameters, i.e., roughness exponent and roughness amplitude, for domain walls in a ferrimagnetic GdFeCo thin film in the creep regime. Histograms of roughness parameters are constructed with more than 40 independent realizations under the same experimental conditions, and the average values and standard deviations are compared in different conditions. We found that the most prominent feature of the obtained distributions is their large standard deviations, which is a signature of large fluctuations. We show that even if the roughness parameters for a particular domain wall are well known, these parameters are not necessarily representative of the underlying physics of the system. In the low field limit, within the creep regime of domain-wall motion, we found the average roughness exponent and roughness amplitude to be around 0.75 and 0.45 μm2, respectively. When an in-plane magnetic field is applied we observed that, even though the distributions are wide, changes in the mean values of roughness parameters can be identified; the roughness exponent decreasing to values around 0.72 while the roughness amplitude increases to 0.65 μm2. Our results call for a careful consideration of statistical averaging over different domains walls when reporting roughness exponents.Fil: Jordán Ringgold, Daniel. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro | Universidad Nacional de Cuyo. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro; ArgentinaFil: Albornoz, Lucas Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; ArgentinaFil: Gorchon, Jon. Lawrence Berkeley National Laboratory; Estados UnidosFil: Lambert, Charles Henri. University of California at Berkeley; Estados UnidosFil: Salahuddin, Sayeef. University of California at Berkeley; Estados UnidosFil: Bokor, Jeffrey. University of California at Berkeley; Estados Unidos. Lawrence Berkeley National Laboratory; Estados UnidosFil: Curiale, Carlos Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; ArgentinaFil: Bustingorry, Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; ArgentinaAmerican Physical Society2020-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/146663Jordán Ringgold, Daniel; Albornoz, Lucas Javier; Gorchon, Jon; Lambert, Charles Henri; Salahuddin, Sayeef; et al.; Statistically meaningful measure of domain-wall roughness in magnetic thin films; American Physical Society; Physical Review B; 101; 18; 5-2020; 1-112469-99502469-9969CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://link.aps.org/doi/10.1103/PhysRevB.101.184431info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevB.101.184431info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T14:53:24Zoai:ri.conicet.gov.ar:11336/146663instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 14:53:25.092CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
title |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
spellingShingle |
Statistically meaningful measure of domain-wall roughness in magnetic thin films Jordán Ringgold, Daniel DOMAIN WALL ROUGHNESS MAGNETISM THIN FILMS |
title_short |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
title_full |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
title_fullStr |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
title_full_unstemmed |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
title_sort |
Statistically meaningful measure of domain-wall roughness in magnetic thin films |
dc.creator.none.fl_str_mv |
Jordán Ringgold, Daniel Albornoz, Lucas Javier Gorchon, Jon Lambert, Charles Henri Salahuddin, Sayeef Bokor, Jeffrey Curiale, Carlos Javier Bustingorry, Sebastian |
author |
Jordán Ringgold, Daniel |
author_facet |
Jordán Ringgold, Daniel Albornoz, Lucas Javier Gorchon, Jon Lambert, Charles Henri Salahuddin, Sayeef Bokor, Jeffrey Curiale, Carlos Javier Bustingorry, Sebastian |
author_role |
author |
author2 |
Albornoz, Lucas Javier Gorchon, Jon Lambert, Charles Henri Salahuddin, Sayeef Bokor, Jeffrey Curiale, Carlos Javier Bustingorry, Sebastian |
author2_role |
author author author author author author author |
dc.subject.none.fl_str_mv |
DOMAIN WALL ROUGHNESS MAGNETISM THIN FILMS |
topic |
DOMAIN WALL ROUGHNESS MAGNETISM THIN FILMS |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 https://purl.org/becyt/ford/2.10 https://purl.org/becyt/ford/2 |
dc.description.none.fl_txt_mv |
Domain walls in magnetic thin films display a complex dynamical response when subject to an external drive. It is claimed that different dynamic regimes are correlated with the domain-wall roughness, i.e., with the fluctuations of domain-wall position due to the inherent disorder in the system. Therefore, key to understanding the dynamics of domain walls is to have a statistically meaningful measure of the domain-wall roughness. Here we present a thorough study of the roughness parameters, i.e., roughness exponent and roughness amplitude, for domain walls in a ferrimagnetic GdFeCo thin film in the creep regime. Histograms of roughness parameters are constructed with more than 40 independent realizations under the same experimental conditions, and the average values and standard deviations are compared in different conditions. We found that the most prominent feature of the obtained distributions is their large standard deviations, which is a signature of large fluctuations. We show that even if the roughness parameters for a particular domain wall are well known, these parameters are not necessarily representative of the underlying physics of the system. In the low field limit, within the creep regime of domain-wall motion, we found the average roughness exponent and roughness amplitude to be around 0.75 and 0.45 μm2, respectively. When an in-plane magnetic field is applied we observed that, even though the distributions are wide, changes in the mean values of roughness parameters can be identified; the roughness exponent decreasing to values around 0.72 while the roughness amplitude increases to 0.65 μm2. Our results call for a careful consideration of statistical averaging over different domains walls when reporting roughness exponents. Fil: Jordán Ringgold, Daniel. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro | Universidad Nacional de Cuyo. Instituto Balseiro. Archivo Histórico del Centro Atómico Bariloche e Instituto Balseiro; Argentina Fil: Albornoz, Lucas Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina Fil: Gorchon, Jon. Lawrence Berkeley National Laboratory; Estados Unidos Fil: Lambert, Charles Henri. University of California at Berkeley; Estados Unidos Fil: Salahuddin, Sayeef. University of California at Berkeley; Estados Unidos Fil: Bokor, Jeffrey. University of California at Berkeley; Estados Unidos. Lawrence Berkeley National Laboratory; Estados Unidos Fil: Curiale, Carlos Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina Fil: Bustingorry, Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina |
description |
Domain walls in magnetic thin films display a complex dynamical response when subject to an external drive. It is claimed that different dynamic regimes are correlated with the domain-wall roughness, i.e., with the fluctuations of domain-wall position due to the inherent disorder in the system. Therefore, key to understanding the dynamics of domain walls is to have a statistically meaningful measure of the domain-wall roughness. Here we present a thorough study of the roughness parameters, i.e., roughness exponent and roughness amplitude, for domain walls in a ferrimagnetic GdFeCo thin film in the creep regime. Histograms of roughness parameters are constructed with more than 40 independent realizations under the same experimental conditions, and the average values and standard deviations are compared in different conditions. We found that the most prominent feature of the obtained distributions is their large standard deviations, which is a signature of large fluctuations. We show that even if the roughness parameters for a particular domain wall are well known, these parameters are not necessarily representative of the underlying physics of the system. In the low field limit, within the creep regime of domain-wall motion, we found the average roughness exponent and roughness amplitude to be around 0.75 and 0.45 μm2, respectively. When an in-plane magnetic field is applied we observed that, even though the distributions are wide, changes in the mean values of roughness parameters can be identified; the roughness exponent decreasing to values around 0.72 while the roughness amplitude increases to 0.65 μm2. Our results call for a careful consideration of statistical averaging over different domains walls when reporting roughness exponents. |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020-05 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/146663 Jordán Ringgold, Daniel; Albornoz, Lucas Javier; Gorchon, Jon; Lambert, Charles Henri; Salahuddin, Sayeef; et al.; Statistically meaningful measure of domain-wall roughness in magnetic thin films; American Physical Society; Physical Review B; 101; 18; 5-2020; 1-11 2469-9950 2469-9969 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/146663 |
identifier_str_mv |
Jordán Ringgold, Daniel; Albornoz, Lucas Javier; Gorchon, Jon; Lambert, Charles Henri; Salahuddin, Sayeef; et al.; Statistically meaningful measure of domain-wall roughness in magnetic thin films; American Physical Society; Physical Review B; 101; 18; 5-2020; 1-11 2469-9950 2469-9969 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/https://link.aps.org/doi/10.1103/PhysRevB.101.184431 info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevB.101.184431 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
American Physical Society |
publisher.none.fl_str_mv |
American Physical Society |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
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CONICET Digital (CONICET) |
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Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1846083064548032512 |
score |
13.22299 |