Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography

Autores
Govyadinov, Alexander A.; Mastel, Stefan; Golmar, Federico; Chuvilin, Andrey; Carney, P. Scott; Hillenbrand, Rainer
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.
Fil: Govyadinov, Alexander A.. CIC nanoGUNE; España
Fil: Mastel, Stefan. CIC nanoGUNE; España
Fil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; España
Fil: Carney, P. Scott. University of Illinois at Urbana; Estados Unidos
Fil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; España
Materia
Chemical Imaging
Nanotomography
Inverse Problems
Near-Field Microscopy
S-Snom
Thin Films
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/33709
Acceder
id CONICETDig_2760712d84ee8ae2664705545a0b36aa
oai_identifier_str oai:ri.conicet.gov.ar:11336/33709
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical NanotomographyGovyadinov, Alexander A.Mastel, StefanGolmar, FedericoChuvilin, AndreyCarney, P. ScottHillenbrand, RainerChemical ImagingNanotomographyInverse ProblemsNear-Field MicroscopyS-SnomThin Filmshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.Fil: Govyadinov, Alexander A.. CIC nanoGUNE; EspañaFil: Mastel, Stefan. CIC nanoGUNE; EspañaFil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; EspañaFil: Carney, P. Scott. University of Illinois at Urbana; Estados UnidosFil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; EspañaAmerican Chemical Society2014-06info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/33709Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-69211936-0851CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/nn5016314info:eu-repo/semantics/altIdentifier/doi/10.1021/nn5016314info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:00:33Zoai:ri.conicet.gov.ar:11336/33709instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:00:33.508CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
title Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
spellingShingle Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
Govyadinov, Alexander A.
Chemical Imaging
Nanotomography
Inverse Problems
Near-Field Microscopy
S-Snom
Thin Films
title_short Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
title_full Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
title_fullStr Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
title_full_unstemmed Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
title_sort Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
dc.creator.none.fl_str_mv Govyadinov, Alexander A.
Mastel, Stefan
Golmar, Federico
Chuvilin, Andrey
Carney, P. Scott
Hillenbrand, Rainer
author Govyadinov, Alexander A.
author_facet Govyadinov, Alexander A.
Mastel, Stefan
Golmar, Federico
Chuvilin, Andrey
Carney, P. Scott
Hillenbrand, Rainer
author_role author
author2 Mastel, Stefan
Golmar, Federico
Chuvilin, Andrey
Carney, P. Scott
Hillenbrand, Rainer
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Chemical Imaging
Nanotomography
Inverse Problems
Near-Field Microscopy
S-Snom
Thin Films
topic Chemical Imaging
Nanotomography
Inverse Problems
Near-Field Microscopy
S-Snom
Thin Films
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.
Fil: Govyadinov, Alexander A.. CIC nanoGUNE; España
Fil: Mastel, Stefan. CIC nanoGUNE; España
Fil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; España
Fil: Carney, P. Scott. University of Illinois at Urbana; Estados Unidos
Fil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; España
description The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.
publishDate 2014
dc.date.none.fl_str_mv 2014-06
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/33709
Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-6921
1936-0851
CONICET Digital
CONICET
url http://hdl.handle.net/11336/33709
identifier_str_mv Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-6921
1936-0851
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/nn5016314
info:eu-repo/semantics/altIdentifier/doi/10.1021/nn5016314
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Chemical Society
publisher.none.fl_str_mv American Chemical Society
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1846781168882548736
score 12.982451

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