Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography
- Autores
- Govyadinov, Alexander A.; Mastel, Stefan; Golmar, Federico; Chuvilin, Andrey; Carney, P. Scott; Hillenbrand, Rainer
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.
Fil: Govyadinov, Alexander A.. CIC nanoGUNE; España
Fil: Mastel, Stefan. CIC nanoGUNE; España
Fil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; España
Fil: Carney, P. Scott. University of Illinois at Urbana; Estados Unidos
Fil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; España - Materia
-
Chemical Imaging
Nanotomography
Inverse Problems
Near-Field Microscopy
S-Snom
Thin Films - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/33709
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oai:ri.conicet.gov.ar:11336/33709 |
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spelling |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical NanotomographyGovyadinov, Alexander A.Mastel, StefanGolmar, FedericoChuvilin, AndreyCarney, P. ScottHillenbrand, RainerChemical ImagingNanotomographyInverse ProblemsNear-Field MicroscopyS-SnomThin Filmshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.Fil: Govyadinov, Alexander A.. CIC nanoGUNE; EspañaFil: Mastel, Stefan. CIC nanoGUNE; EspañaFil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; EspañaFil: Carney, P. Scott. University of Illinois at Urbana; Estados UnidosFil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; EspañaAmerican Chemical Society2014-06info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/33709Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-69211936-0851CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/nn5016314info:eu-repo/semantics/altIdentifier/doi/10.1021/nn5016314info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:32:34Zoai:ri.conicet.gov.ar:11336/33709instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:32:34.454CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
title |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
spellingShingle |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography Govyadinov, Alexander A. Chemical Imaging Nanotomography Inverse Problems Near-Field Microscopy S-Snom Thin Films |
title_short |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
title_full |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
title_fullStr |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
title_full_unstemmed |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
title_sort |
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography |
dc.creator.none.fl_str_mv |
Govyadinov, Alexander A. Mastel, Stefan Golmar, Federico Chuvilin, Andrey Carney, P. Scott Hillenbrand, Rainer |
author |
Govyadinov, Alexander A. |
author_facet |
Govyadinov, Alexander A. Mastel, Stefan Golmar, Federico Chuvilin, Andrey Carney, P. Scott Hillenbrand, Rainer |
author_role |
author |
author2 |
Mastel, Stefan Golmar, Federico Chuvilin, Andrey Carney, P. Scott Hillenbrand, Rainer |
author2_role |
author author author author author |
dc.subject.none.fl_str_mv |
Chemical Imaging Nanotomography Inverse Problems Near-Field Microscopy S-Snom Thin Films |
topic |
Chemical Imaging Nanotomography Inverse Problems Near-Field Microscopy S-Snom Thin Films |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples. Fil: Govyadinov, Alexander A.. CIC nanoGUNE; España Fil: Mastel, Stefan. CIC nanoGUNE; España Fil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; España Fil: Carney, P. Scott. University of Illinois at Urbana; Estados Unidos Fil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; España |
description |
The increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-06 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/33709 Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-6921 1936-0851 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/33709 |
identifier_str_mv |
Chuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-6921 1936-0851 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/nn5016314 info:eu-repo/semantics/altIdentifier/doi/10.1021/nn5016314 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
American Chemical Society |
publisher.none.fl_str_mv |
American Chemical Society |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
_version_ |
1844612994672099328 |
score |
13.070432 |