Sambuco Salomone, L. I., García Inza, M. A., Carbonetto, S. H., & Faigon, A. N. (2021). Numerical modeling of radiation-induced charge loss in CMOS floating gate cells. Web
Citación estilo ChicagoSambuco Salomone, Lucas Ignacio, Mariano Andrés García Inza, Sebastián Horacio Carbonetto, and Adrián Néstor Faigon. Numerical Modeling of Radiation-induced Charge Loss in CMOS Floating Gate Cells. 2021.
Cita MLASambuco Salomone, Lucas Ignacio, Mariano Andrés García Inza, Sebastián Horacio Carbonetto, and Adrián Néstor Faigon. Numerical Modeling of Radiation-induced Charge Loss in CMOS Floating Gate Cells. 2021.
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